IP Library Granted Patent US 12704794
Granted Patent B2
US 12704794 · App. 18/354,078 · Granted Aug 11, 2026

Imprinting method, imprint apparatus and article manufacturing method

Inventor: Yuji Sakata (Tochigi, JP)
Assignee: CANON KABUSHIKI KAISHA
G03F9/7042G03F7/0002
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12704794
App. No.
18/354,078
Granted
Aug 11, 2026
Kind
B2
Abstract

The throughput is improved by changing a timing of beginning aligning between a mold and a substrate depending on an area in a pattern-forming region where a pattern can be formed. An imprinting method for forming a pattern of an imprint material in a plurality of pattern-forming regions on a substrate using a mold having a pattern portion, having contacting the mold and the imprint material and relatively aligning the mold and the pattern-forming region based on a positional relationship between the mold and an alignment mark of each pattern-forming region, in which, in the aligning, a timing of beginning the aligning is earlier relative to the contacting if an area in the plurality of pattern-forming regions where a pattern can be formed is a second area that is wider than a first area than if an area is the first area.

Claims (24)

1 . An imprinting method for forming a pattern of an imprint material in a plurality of pattern-forming regions on a substrate using a mold having a pattern portion, the method comprising:

contacting the mold and the imprint material to bring the pattern portion into contact with a pattern-forming region of the plurality of pattern-forming regions, pressing the contacted pattern portion and the imprint material on the pattern-forming region by applying a pressure between the mold and the pattern-forming region to widen a contact area between the mold and the imprint material in the pattern-forming region, and decompressing the contacted pattern portion by decreasing the pressure between the mold and the pattern-forming region to put at least the contacted pattern portion into a flat state after the pressing is completed; and

relatively aligning the mold and the pattern-forming region based on a positional relationship between the mold and an alignment mark of the pattern-forming region,

wherein, in the aligning, a timing of beginning the aligning is determined based on whether a variation in relative positions between the mold and the pattern-forming region during the decompressing is within a permissible range, such that the aligning begins during a period of the decompressing if an area in the pattern-forming region where the pattern can be formed is a second area corresponding to a full field region having a contour that is not limited by the edge of the substrate, the second area being wider than a first area corresponding to a partial field region having a contour that is limited by an edge of the substrate.

2 . The imprinting method according to claim 1 ,

wherein a timing of beginning the contacting is ahead of the timing of beginning the aligning.

3 . The imprinting method according to claim 1 ,

wherein the aligning is changed to begin after the decompressing is completed or during a period of the decompressing depending on an area in the plurality of pattern-forming regions where the pattern can be formed.

4 . The imprinting method according to claim 3 ,

wherein the aligning begins during a period of the decompressing if a proportion of an area of the pattern in the pattern-forming region is a predetermined value or more.

5 . The imprinting method according to claim 3 ,

wherein the aligning begins after the decompressing is completed if the proportion of the area of the pattern in the pattern-forming region is less than the predetermined value.

6 . The imprinting method according to claim 1 ,

wherein the aligning begins during a period of the decompressing if at least a deviation between a central portion of the pattern portion and a central region in an effective area of the pattern-forming region is less than a predetermined threshold value when the pattern portion has been contacted to the imprint material.

7 . The imprinting method according to claim 1 ,

wherein the aligning begins after the decompressing is completed if at least a deviation between a central portion of the pattern portion and a central region in an effective area of the pattern-forming region is a predetermined threshold value or more when the pattern portion has been contacted to the imprint material.

8 . An article manufacturing method, comprising:

pattern-forming of forming a pattern on a substrate using an imprint apparatus having:

a moving unit configured to relatively move a mold and the substrate so that a pattern portion of the mold is contacted to an imprint material on a pattern-forming region;

a pressing unit configured to press the contacted pattern portion and the imprint material on the pattern-forming region by applying a pressure between the mold and the pattern-forming region to widen a contact area between the mold and the imprint material in the pattern-forming region, and decompress the contacted pattern portion by decreasing the pressure between the mold and the pattern-forming region to put at least the contacted pattern portion into a flat state after the pressing is completed; and

a control unit configured to control the moving unit so that the mold and the pattern-forming region are relatively aligned based on a positional relationship between the mold and an alignment mark of the pattern-forming region,

in which the control unit is further configured to determine a timing of beginning the aligning between the mold and the pattern-forming region based on whether a variation in relative positions between the mold and the pattern-forming region during the decompressing is within a permissible range, such that the aligning begins during a period of the decompressing if an area in a pattern-forming region where the pattern can be formed is a second area corresponding to a full field region having a contour that is not limited by the edge of the substrate, the second area being wider than a first area corresponding to a partial field region having a contour that is limited by an edge of the substrate;

processing the substrate on which the pattern is formed in the pattern-forming; and

manufacturing an article from the substrate processed in the processing.