IP Library Granted Patent US 12707676
Granted Patent B2
US 12707676 · App. 18/508,612 · Granted Aug 11, 2026

Semiconductor device, semiconductor module, and method for manufacturing semiconductor device

Inventors: Kazushiro Nomura (Kawasaki Kanagawa, JP); Kenichi Ohashi (Kawasaki Kanagawa, JP); Soichi Yamashita (Kawasaki Kanagawa, JP); Kentaro Mori (Fujisawa Kanagawa, JP); Aya Murayoshi (Ichihara Chiba, JP); Hiroki Okuyama (Yokohama Kanagawa, JP)
Assignees: Kabushiki Kaisha Toshiba; Toshiba Electronic Devices & Storage Corporation
H10D30/6728H10D30/031H10D30/6729H10D64/252H10D84/013H10D84/016H10D84/038H10P72/7402
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Quick Facts
Patent No.
US 12707676
App. No.
18/508,612
Granted
Aug 11, 2026
Kind
B2
Abstract

A semiconductor device according to an embodiment includes a first electrode having a first main surface and a second main surface opposite to the first main surface, a semiconductor substrate disposed on the second main surface, and a second electrode disposed on a fourth main surface of the semiconductor substrate opposite to a third main surface in contact with the first electrode. The first electrode has a first side surface substantially perpendicularly intersecting with the first main surface, and a second side surface substantially perpendicularly intersecting with both the first main surface and the first side surface, and the first main surface, the first side surface, and the second side surface are connected to each other via a curved surface.

Claims (47)

1 . A semiconductor device comprising:

a first electrode that has a first main surface and a second main surface opposite to the first main surface;

a semiconductor substrate that is disposed on the second main surface; and

a second electrode that is disposed on a fourth main surface of the semiconductor substrate opposite to a third main surface in contact with the first electrode, wherein

the first electrode has a first side surface substantially perpendicularly intersecting with the first main surface, and a second side surface substantially perpendicularly intersecting with both the first main surface and the first side surface, and

the first main surface, the first side surface, and the second side surface are connected to each other via a curved surface.

2 . The semiconductor device according to claim 1 , wherein

the first electrode is rounded at all corners of the first main surface.

3 . The semiconductor device according to claim 1 , wherein

the first main surface and the first side surface are connected to each other via a curved surface.

4 . The semiconductor device according to claim 3 , wherein

the first electrode is rounded at all side portions of the first main surface.

5 . The semiconductor device according to claim 1 , wherein

a total of thicknesses of the first electrode, the semiconductor substrate, and the second electrode is equal to or less than 50 μm.

6 . The semiconductor device according to claim 1 , wherein

a radius of curvature of the curved surface is equal to or more than 10 μm.

7 . The semiconductor device according to claim 1 , wherein

the semiconductor device is a vertical MOSFET,

the first electrode is a drain electrode, and

the second electrode is a source electrode.

8 . A semiconductor module comprising:

the semiconductor device according to claim 1 ;

a first metal member that is electrically connected to the first electrode;

a second metal member that is electrically connected to the second electrode; and

a sealing material that seals the semiconductor device.

9 . The semiconductor device according to claim 1 , wherein

the semiconductor substrate has the third main surface, a third side surface substantially perpendicularly intersecting with the third main surface, and a fourth side surface substantially perpendicularly intersecting with both the third main surface and the third side surface, and

the third main surface, the third side surface, and the fourth side surface are connected to each other via a second curved surface.

10 . The semiconductor device according to claim 9 , wherein

the semiconductor substrate is rounded at all corners of the third main surface.

11 . The semiconductor device according to claim 9 , wherein

the third main surface and the third side surface are connected to each other via a curved surface.

12 . The semiconductor device according to claim 11 , wherein

the semiconductor substrate is rounded at all side portions of the third main surface.

13 . The semiconductor device according to claim 9 , wherein

a total of thicknesses of the first electrode, the semiconductor substrate, and the second electrode is equal to or less than 50 μm.

14 . The semiconductor device according to claim 9 , wherein

a radius of curvature of at least one of the curved surface and the second curved surface is equal to or more than 10 μm.

15 . The semiconductor device according to claim 9 , wherein

the semiconductor device is a vertical MOSFET,

the first electrode is a drain electrode, and

the second electrode is a source electrode.

16 . A semiconductor module comprising:

the semiconductor device according to claim 9 ;

a first metal member that is electrically connected to the first electrode;

a second metal member that is electrically connected to the second electrode; and

a sealing material that seals the semiconductor device.