Dual UV-Vis reflectance absorbance and photoluminescence modules
Devices, systems, and methods for characterizing material samples. In one aspect, a device for characterizing a sample includes a substrate configured for receiving a sample thereon; an optical fiber probe comprising a first end positioned near the sample and a second end that is bifurcated to include one or more first fiber configured for connection to a first light emitting device and one or more second fiber configured for connection to a spectrometer; a reflectance module coupled to the substrate; and a second light emitting device positioned near the sample. The optical fiber probe is configured for selectively obtaining at the spectrometer both a reflectance absorbance measurement of the sample associated with the first light emitting device and a photoluminescence measurement of the sample associated with the second light emitting device.
1 . A device for characterizing a sample, the device comprising:
a substrate configured to hold a sample;
a reflectance module coupled to the substrate;
a first light emitting device configured to emit a first light;
a second light emitting device configured to emit a second light directly towards the substrate;
a spectrometer; and
an optical fiber probe comprising a first end proximal to the substrate and a second end bifurcating into a first branch and a second branch, the first branch comprising at least one first optical fiber configured to optically couple to the first light emitting device and the second branch comprising at least one second optical fiber configured to optically couple to the spectrometer; wherein the optical fiber probe is configured to transmit to the spectrometer:
(i) a first signal corresponding to a reflectance absorbance measurement of the sample using the first light emitted by the first light emitting device; and
(ii) a second signal corresponding to a photoluminescence measurement of the sample using the second light emitted by the second light emitting device.
2 . The device of claim 1 , further comprising a spin coater device comprising a rotating element wherein the substrate is mounted on the rotating element and the reflectance module is attached to the rotating element.
3 . The device of claim 1 , further comprising a camera configured to capture one or more images of the sample, wherein the sample is one from the group consisting of a thin film, a bulk surface, a bulk material, a biological material, and a solid-state material, or a combination thereof.
4 . The device of claim 1 , wherein the first light emitting device comprises a broadband light source configured to emit the first light as ultraviolet light and visible light.
5 . The device of claim 1 , wherein the second light emitting device is a tunable light source.
6 . The device of claim 1 , further comprising a controller in communication with the first light emitting device and with the second light emitting device, the controller programmed to enable dual measurements by the spectrometer by activating the first light emitting device without activating the second light emitting device and by activating the second light emitting device without activating the first light emitting device.
7 . The device of claim 1 , further comprising a graphical user interface configured to display, in real time, the reflectance absorbance measurement and the photoluminescence measurement.
8 . A method of characterizing a sample using the device of claim 1 , the method comprising:
positioning a sample on the substrate;
positioning the first end of the optical fiber probe near the sample;
connecting the at least one first fiber to the first light emitting device;
connecting the at least one second fiber to the spectrometer;
positioning the second light emitting device near the sample;
transmitting to the spectrometer the first signal by activating the first light emitting device;
transmitting to the spectrometer the second signal by activating the second emitting device; and
charactering the sample using the spectrometer.
9 . The method of claim 8 , wherein the substrate is mounted on a rotating element of a spin coater device.
10 . The method of claim 9 , wherein the reflectance module is screwed onto the rotating element.
11 . The method of claim 8 , further comprising activating the first light emitting device a second time and activating the second light emitting device a second time.
12 . The method of claim 8 , further comprising displaying, in real time, the reflectance absorbance measurement and the photoluminescence measurement.
13 . The method of claim 8 , wherein the sample is selected from the group consisting of a thin film, a bulk surface, a bulk material, a biological material, and a solid-state material, or a combination thereof.