IP Library Granted Patent US 12709569
Granted Patent B2
US 12709569 · App. 17/763,856 · Granted Aug 18, 2026

Fiber optics plate, scintillator panel, radiation detector, electron microscope, X-ray blocking method and electron beam blocking method

Inventors: Tomoyuki Nakayama (Hamamatsu, JP); Takuya Sakai (Hamamatsu, JP); Kosuke Tomita (Hamamatsu, JP); Yoshinori Yamamoto (Hamamatsu, JP)
Assignee: HAMAMATSU PHOTONICS K.K.
C03C13/046C03C3/068C03C3/155C09K11/616G01N23/06G01T1/2018C03C2213/00G01N2223/04G01N2223/505
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Quick Facts
Patent No.
US 12709569
App. No.
17/763,856
Granted
Aug 18, 2026
Kind
B2
Abstract

A fiber optic plate 122 including a plurality of core glasses 122 a , a clad glass 122 b covering the core glass 122 a , and a light-absorbing glass 122 c disposed between the plurality of core glasses 122 a , wherein a content of TiO 2 in the core glass 122 a is 7% by mass or less, a content of B 2 O 3 in the core glass 122 a is 15% by mass or more, and a content of WO 3 in the core glass 122 a is more than 0% by mass.

Claims (37)

1 . A fiber optic plate comprising:

a plurality of core glasses;

a clad glass covering the core glass; and

a light-absorbing glass disposed between the plurality of core glasses,

wherein a content of TiO 2 in the core glass is 7% by mass or less,

a content of B 2 O 3 in the core glass is 15% by mass or more and 19% by mass or less,

a content of SiO 2 in the core glass is 2 to 3.5% by mass, and

a content of WO 3 in the core glass is 14 to 17% by mass.

2 . The fiber optic plate according to claim 1 , wherein the content of TiO 2 in the core glass is 0.1% by mass or less.

3 . The fiber optic plate according to claim 1 , wherein the content of B 2 O 3 in the core glass is 18.5% by mass or more.

4 . The fiber optic plate according to claim 1 , wherein a content of Gd 2 O 3 in the core glass is 25% by mass or less.

5 . The fiber optic plate according to claim 1 , wherein a content of ZrO 2 in the core glass is 2.5% by mass or less.

6 . The fiber optic plate according to claim 1 , wherein a d-line refractive index n d of the core glass is 1.85 or less.

7 . A scintillator panel comprising:

the fiber optic plate according to claim 1 ; and

a scintillator disposed on the fiber optic plate.

8 . The scintillator panel according to claim 7 ,

wherein the scintillator comprises a columnar crystal containing cesium iodide, and

the columnar crystal has a root on the side of the fiber optic plate.

9 . The scintillator panel according to claim 7 , further comprising a protective film covering at least a portion of the scintillator opposite to the fiber optic plate.

10 . A radiation detector comprising:

a radiation irradiator;

an imaging device comprising a CCD image sensor or a CMOS image sensor; and

the scintillator panel according to claim 7 ,

wherein the scintillator panel is disposed between the radiation irradiator and the imaging device, and

the scintillator is disposed on the side of the radiation irradiator in the scintillator panel.

11 . An X-ray blocking method of blocking at least a portion of X-rays directed to the imaging device by the fiber optic plate when an object is irradiated with the X-rays from the radiation irradiator in a state where the object is disposed between the radiation irradiator and the scintillator in the radiation detector according to claim 10 .

12 . An electron beam blocking method of blocking at least a portion of electron beams directed to the imaging device by the fiber optic plate when an object is irradiated with the electron beams from the radiation irradiator in a state where the object is disposed between the radiation irradiator and the scintillator in the radiation detector according to claim 10 .

13 . An electron microscope comprising:

an electron beam source;

an electron optical system irradiating a sample with electron beams emitted from the electron beam source;

a sample mounting part holding the sample;

the scintillator panel according to claim 7 ; and

an imaging device comprising a CCD image sensor or a CMOS image sensor,

wherein the scintillator panel is disposed between the electron beam source and the imaging device,

the scintillator is disposed on the side of the electron beam source in the scintillator panel,

an electron beam penetrating through or being scattered in the sample among the electron beams is converted into an optical image by the scintillator of the scintillator panel, and the optical image is captured by the imaging device.