Force input processing and dynamic force thresholds

1 . An electronic device comprising:

a plurality of electrodes;

sensing circuitry coupled to the plurality of electrodes and configured to sense one or more parameters at the plurality of electrodes; and

processing circuitry coupled to the sensing circuitry, the processing circuitry programmed to:

process the one or more parameters sensed at the plurality of electrodes to account for one or more environmental variations or device-specific characteristics to generate one or more processed parameters;

determine a force exerted on one or more electrodes of the plurality of electrodes based on the one or more processed parameters;

combine the force exerted on the one or more electrodes of the plurality of electrodes into a combined parameter corresponding to an applied force to a surface of the electronic device; and

in accordance with a determination that one or more first criteria are satisfied, the one or more first criteria including a criterion that is satisfied when the combined parameter is at or greater than a first threshold, detect a click event.

2 . The electronic device of claim 1 , wherein the combined parameter corresponding to the applied force represents a squeezing force applied by a plurality of objects to a perimeter of the surface.

3 . The electronic device of claim 1 , wherein combining the force exerted on the one or more electrodes of the plurality of electrodes into the combined parameter comprises scaling one or more force measurements corresponding to the force exerted on the one or more electrodes of the plurality of electrodes.

4 . The electronic device of claim 3 , wherein scaling the one or more force measurements comprises scaling by a constant scaling value for each of the one or more parameters force measurements.

5 . The electronic device of claim 3 , wherein scaling the one or more force measurements comprises scaling a plurality of the one or more force measurements by a plurality of constant scaling values including scaling a first force measurement of the plurality of the one or more force measurements by a first constant scaling value and a second force measurement of the plurality of the one or more force measurements by a second constant scaling value different from the first constant scaling value.

6 . The electronic device of claim 3 , wherein the plurality of electrodes is a two-dimensional array of electrodes and the one or more force measurements are represented using a one-dimensional vector.

7 . The electronic device of claim 6 , wherein scaling the one or more force measurements comprises a product of a scaling matrix and the one-dimensional vector.

8 . The electronic device of claim 7 , wherein the scaling matrix is a diagonal matrix with one or more scaling values.

9 . The electronic device of claim 6 , wherein combining the one or more force exerted on the one or more electrodes of the plurality of electrodes into the combined parameter comprises computing a norm of the one-dimensional vector.

10 . The electronic device of claim 9 , wherein computing the norm of the one-dimensional vector comprises an absolute norm, a Euclidean norm, a semi-norm, a maximum norm, an Lp norm, or a weighted norm.

11 . The electronic device of claim 1 , further comprising:

one or more sensors different from the plurality of electrodes;

wherein the processing circuitry further programmed to:

adjust the first threshold based on data from the one or more sensors.

12 . The electronic device of claim 11 , wherein adjusting the first threshold based on the data from the one or more sensors comprises fusion of data from a plurality of sensors.

13 . The electronic device of claim 11 , wherein the one or more sensors includes an accelerometer, a gyroscope, a force sensor different from the plurality of electrodes, a touch sensor, and/or a proximity sensor.

14 . The electronic device of claim 11 , the processing circuitry further programmed to:

adjust the first threshold based on information from a second electronic device in communication with the electronic device.

15 . The electronic device of claim 1 , the processing circuitry further programmed to:

in accordance with a determination that one or more second criteria are satisfied, the one or more second criteria including a criterion that is satisfied when the combined parameter is less than a second threshold, detect an unclick event.

16 . The electronic device of claim 15 , wherein the second threshold is based on the first threshold.

17 . The electronic device of claim 16 , wherein the second threshold is less than the first threshold by a predetermined percentage.

18 . The electronic device of claim 15 , further comprising:

one or more sensors different from the plurality of electrodes;

wherein the processing circuitry further programmed to:

adjust the second threshold based on data from the one or more sensors.

19 . The electronic device of claim 1 , the processing circuitry further programmed to:

detect a state of the electronic device;

in accordance with detecting the state of the electronic device is a first state, maintain the first threshold at a predetermined threshold; and

in accordance with detecting the state is a second state, different from the first state, adjust the first threshold to a different threshold greater than the predetermined threshold.

20 . A method comprising:

at an electronic device including a plurality of electrodes, sensing circuitry coupled to the plurality of electrodes and configured to sense one or more parameters at the plurality of electrodes, and processing circuitry coupled to the sensing circuitry:

capturing one or more parameters at the plurality of electrodes via the sensing circuitry;

processing the one or more parameters to account for one or more environmental variations or device-specific characteristics, wherein processing the one or more parameters includes generating one or more processed parameters;

determining a force exerted on each electrode of the plurality of electrodes based on the processed one or more parameters;

aggregating the force exerted on each electrode of the plurality of electrodes into a combined force parameter; and

determining a state of the electronic device based on the combined force parameter.