IP Library Granted Patent US 12710360
Granted Patent B2
US 12710360 · App. 18/111,056 · Granted Aug 18, 2026

Light recycling article for bio-assay

Inventors: Bharat R. Acharya (Woodbury, MN); Raj Rajagopal (Woodbury, MN); Gregory W. Sitton (Minneapolis, MN); Benjamin G. Sonnek (Mahtomedi, MN); Robert M. Biegler (Woodbury, MN); Gilles J. Benoit (Minneapolis, MN); Timothy J. Lindquist (Woodbury, MN); John A. Wheatley (Stillwater, MN); Kristal L. Schutta (Forest Lake, MN); James A. Phipps (River Falls, WI)
Assignee: 3M Innovative Properties Company
G01N21/314G01N21/0303G01N2021/317G01N21/6452G01N2201/0453
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12710360
App. No.
18/111,056
Granted
Aug 18, 2026
Kind
B2
Abstract

An optical well is configured to receive a test sample for examining an optical characteristic of the sample at a first wavelength in a predetermined wavelength range. The optical well includes a wall having a bottom wall portion and a sidewall portion defining a chamber for receiving the test sample, and an optical film formed into a shape so that a portion of the sidewall portion includes a first portion of the optical film, and a portion of the bottom wall portion includes a second portion of the optical film. For a normally incident light, the microlayers in each of the first and second portions have an average optical reflectance of greater than about 80% in the predetermined wavelength range. The forming results in the plurality of microlayers of the integral formed optical film having a thinnest portion and a thickest portion having a thickness difference of at least 30%.

Claims (21)

1 . An optical well configured to receive a test sample for examining at least a first optical characteristic of the test sample at at least a first wavelength in a predetermined continuous wavelength range that is at least 150 nm wide and comprises at least a blue wavelength and a red wavelength, the optical well comprising:

a wall comprising a bottom wall portion and a sidewall portion extending upwardly from the bottom wall portion, the bottom wall portion and the sidewall portion defining a chamber for receiving the test sample; and

an integral and continuous thermoformed optical film formed into a shape so that at least a portion of the sidewall portion of the optical well comprises a first portion of the integral formed optical film and at least a portion of the bottom wall portion of the optical well comprises a different second portion of the integral formed optical film, the integral formed optical film comprising a plurality of microlayers numbering at least 10 in total, each of the microlayers having an average thickness of less than about 500 nm, such that for a normally incident light and for at least one polarization state, the plurality of microlayers in each of the first and second portions of the integral formed optical film has an average optical reflectance of greater than about 80% in the predetermined wavelength range,

wherein, the forming results in the plurality of microlayers of the integral formed optical film having a thinnest portion and a thickest portion having a thickness difference of at least 30%.

2 . The optical well of claim 1 , wherein the at least the first optical characteristic of the test sample at the at least the first wavelength comprises an optical absorption of the test sample at the at least the first wavelength.

3 . The optical well of claim 1 , wherein the at least the first optical characteristic of the test sample at the at least the first wavelength comprises a light emission by the test sample at the at least the first wavelength.

4 . The optical well of claim 1 further comprising a protective layer disposed on an exterior side of the optical well opposite the chamber, the protective layer conforming and bonded to the formed optical film via a bonding layer.

5 . The optical well of claim 1 , wherein for the substantially normally incident light and for the at least one polarization state,

the plurality of microlayers in each of the first and second portions of the integral formed optical film has a minimum optical reflectance of greater than about 70% in the predetermined wavelength range.

6 . The optical well of claim 1 , wherein for the at least one polarization state and for incident angles of at least up to 30 degrees, the plurality of microlayers in each of the first and second portions of the integral formed optical film has an average optical reflectance of greater than about 80% in the predetermined wavelength range.

7 . The optical well of claim 1 , wherein the predetermined continuous wavelength range comprises at least one ultraviolet wavelength.

8 . The optical well of claim 1 , wherein the predetermined continuous wavelength range extends from about 300 nm to about 750 nm.

9 . The optical well of claim 1 , wherein the integral and continuous formed optical film is formed by one or more of compression molding, thermoforming, vacuum forming, pressure forming, blow molding, embossing, and insert molding.

10 . The optical well of claim 1 , wherein the at least the first optical characteristic of the test sample at the at least the first wavelength comprises a light emission by the test sample at the at least the first wavelength when the test sample is illuminated with light having a wavelength less than the at least the first wavelength.

11 . An article comprising a plurality of optical wells of claim 1 arranged regularly in rows and columns of the optical wells.

12 . The article of claim 11 comprising at least 4 of the optical wells.

13 . An optical system comprising:

the article of claim 12 ;

a plurality of light sources configured to emit first lights having the first wavelength into the optical wells;

the test sample disposed in each of the optical wells; and

a plurality of detectors configured to detect at least the emitted first lights.