IP Library Granted Patent US 12710370
Granted Patent B2
US 12710370 · App. 18/709,193 · Granted Aug 18, 2026

Raman scattered light measurement system and Raman scattered light measurement method

Inventors: Hidemi Shigekawa (Tsukuba, JP); Yusuke Arashida (Tsukuba, JP)
Assignee: Bio-Xcelerator, Inc.
G01N21/65G01N2201/06113
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Quick Facts
Patent No.
US 12710370
App. No.
18/709,193
Granted
Aug 18, 2026
Kind
B2
Abstract

A Raman scattered light measurement system includes a Stokes light generation unit configured to generate broadband Stokes light, a pump light generation unit configured to generate narrowband pump light, and a wavelength change unit configured to change a center wavelength of the pump light in two different wavelengths.

Claims (47)

1 . A Raman scattered light measuring system comprising;

a Stokes light generator configured to generate Stokes light with a broad band;

a pump light generator configured to generate pump light with a narrow band;

a wavelength changing unit configured to change center wavelength of the pump light in two different wavelengths;

a measurement device configured to measure a signal intensity at each frequency of reflected light obtained by irradiating a sample with the pump light and the Stokes light to obtain a signal intensity measurement value; and

a calculation device configured to calculate a difference between the signal intensity measurement values for each frequency before and after the wavelength changing unit changes the center wavelength of the pump light.

2 . The Raman scattered light measuring system according to claim 1 ,

wherein the wavelength changing unit comprises a bandpass filter disposed in an optical path of the pump light and an operating mechanism configured to move or rotate the bandpass filter,

wherein the wavelength changing unit changes the wavelength of the pump light by move or rotate the bandpass filter to change an incident angle of the pump light incident on the bandpass filter.

3 . The Raman scattered light measuring system according to claim 2 ,

wherein the operating mechanism is a galvanometer scanner.

4 . The Raman scattered light measuring system according to claim 1 ,

wherein the pump light and the Stokes light are light in an infrared region.

5 . The Raman scattered light measuring system according to claim 1 ,

wherein the pump light generator comprises: a first pump light generator configured to output first pump light having a center wavelength of a first wavelength; a second pump light generator configured to output second pump light having a center wavelength of a second wavelength; and a pump light selector configured to selectively irradiate sample with one of the first pump light and the second pump light.

6 . The Raman scattered light measuring system according to claim 1 ,

further comprising a pump light amplification unit configured to amplify an intensity of the pump light.

7 . The Raman scattered light measuring system according to claim 1 ,

wherein the pump light generation unit and the Stokes light generation unit comprise same light source,

the Raman scattered light measuring system further comprising:

a first optical element branching the light output from the light source to obtain reference light;

a second optical element guiding the reflected light and the reference light to same optical path as evaluation light;

a spectrometer spatially dispersing the evaluation light for each wavelength;

an optical sensor configured to receive the evaluation light that is spatially dispersed; and

a calculation device configured to calculate the intensity of the reflected light at least one wavelength using the output of the optical sensor.

8 . A Raman scattering light measuring method comprising:

generating broadband Stokes light;

generating narrowband pump light;

changing a center wavelength of the pump light in two different wavelengths;

measuring a signal intensity for each frequency of reflected light obtained by irradiating a sample with the pump light and the Stokes light; and

calculating a difference in the signal intensity for each frequency before and after the center wavelength of the pump light is changed;

measuring a signal intensity at each frequency of reflected light obtained by irradiating a sample with the pump light and the Stokes light to obtain a signal intensity measurement value; and

calculating a difference between the signal intensity measurement values for each frequency before and after the wavelength changing unit changes the center wavelength of the pump light.

9 . The Raman scattered light measuring method according to claim 8 , wherein

the wavelength of the pump light is changed to change an incident angle of the pump light incident.

10 . The Raman scattered light measuring method according to claim 8 , wherein

the pump light and the Stokes light are light in an infrared region.

11 . The Raman scattered light measuring method according to claim 8 , further comprising

amplifying an intensity of the pump light.

12 . The Raman scattered light measuring method according to claim 8 , wherein

the pump light and the Stokes light are generated with one light source, and

the Raman scattered light measuring method further comprises:

branching light that is output from the light source to obtain reference light;

guiding the reflected light and the reference light to same optical path as evaluation light;

dispersing the evaluation light for each wavelength;

receiving the evaluation light that is spatially dispersed; and

calculating the intensity of the reflected light at least one wavelength using the received evaluation light.