X-ray detector for X-ray diffraction analysis apparatus

1 . An X-ray detector for an X-ray diffraction analysis apparatus, the X-ray detector comprising:

a sensor for converting an X-ray photon incident on the sensor into a sensor output signal;

a readout circuit configured to determine an X-ray photon count, by counting the sensor output signal;

a processor configured to:

determine an X-ray intensity value using the X-ray photon count;

generate a display signal for displaying an image representing the X-ray intensity value; and

communicate the display signal to a display device for displaying the image representing the X-ray intensity value; and

a housing containing the sensor, the readout circuit and the processor, wherein the display device is attached to the housing.

2 . The X-ray detector of claim 1 , further comprising:

an environmental sensor configured to measure an environmental parameter; and

a non-volatile memory, wherein the X-ray detector is configured to store a plurality of measurements obtained by the environmental sensor as environmental data and the processor is configured to generate a display signal for displaying the environmental data.

3 . The X-ray detector of claim 1 wherein the display device displays the image representing the X-ray intensity value.

4 . The X-ray detector of claim 1 , wherein the sensor comprises an array of detection cells and is configured to detect X-ray photons in a position sensitive manner.

5 . The X-ray detector of claim 1 , wherein the sensor is a microstrip detector comprising a plurality of detection cells, each detection cell having a corresponding strip electrode.

6 . The X-ray detector of claim 1 , wherein the X-ray detector is a solid-state detector.

7 . An X-ray analysis apparatus comprising:

an enclosure;

the X-ray detector according to claim 1 ; and

a goniometer for supporting an X-ray source and the X-ray detector, wherein the goniometer and the X-ray detector are arranged inside the enclosure.

8 . The X-ray detector of claim 2 , wherein the environmental sensor comprises a temperature sensor for measuring the temperature of the X-ray detector.

9 . The X-ray detector of claim 3 , wherein the display device is a touchscreen and/or a liquid crystal display device.

10 . The X-ray detector of claim 3 , wherein the image is a graphic image.

11 . The X-ray detector of claim 4 , wherein the processor is configured to:

determine a plurality of X-ray intensity values, each X-ray intensity value corresponding to a respective detection cell; and

output an image representing the relative magnitude of the X-ray intensity values.

12 . The X-ray analysis apparatus of claim 7 further comprising an X-ray source mounted to the goniometer, and an alignment adjustment mechanism for altering the position of the X-ray detector relative to the X-ray source.

13 . The X-ray analysis apparatus of claim 7 , wherein the enclosure further comprises an X-ray protective viewing window.

14 . A method of using the X-ray analysis apparatus according to claim 7 , the method comprising:

generating X-rays for irradiating the X-ray detector;

receiving, at the X-ray detector, X-rays from the X-ray source; and

displaying an image representing an X-ray intensity value.

15 . The method of claim 14 , further comprising changing the position of the X-ray source or the X-ray detector based on the displayed image.