Method and system for phase jitter and phase noise measurements using oscilloscopes

1 . A method for measuring the phase jitter and phase noise of a signal-under-test (SUT), comprising:

providing first and second oscilloscopes each having a timebase reference oscillator, the timebase reference oscillator of each of the first and second oscilloscopes configured to generate a timebase reference signal of a given output frequency;

phase-locking the timebase reference oscillators of the first and second oscilloscopes together;

applying the SUT to an input channel of the first oscilloscope and to an input channel of the second oscilloscope;

generating a first phase jitter measurement of the SUT using the first oscilloscope and generating a second phase jitter measurement of the SUT using the second oscilloscope; and

obtaining the phase jitter and phase noise of the SUT from the first and second phase jitter measurements,

wherein an adjustment update rate of the phase-locking of the timebase oscillators is below a lowest intended offset frequency content of the phase jitter and phase noise measurements.

2 . The method of claim 1 , wherein obtaining the phase jitter and phase noise of the SUT comprises cross-correlating the first and second phase jitter measurements to obtain the cross-correlated phase jitter and phase noise of the SUT.

3 . The method of claim 1 , wherein obtaining the phase jitter and phase noise of the SUT comprises determining a phase jitter spectrum of the first and second phase jitter measurements, cross-correlating the determined phase jitter spectrums together, and obtaining the phase noise from the cross-correlated phase jitter spectrums.

4 . The method of claim 1 , wherein an adjustment update rate of the phase-locking of the timebase oscillators is 1 Hz or less.

5 . The method of claim 1 , wherein phase-locking of the timebase reference oscillators includes:

outputting a first clock signal from the first oscilloscope synchronized with the timebase reference signal of the first oscilloscope;

outputting a second clock signal from the second oscilloscope synchronized with the timebase reference signal of the second oscilloscope;

applying the first and second clock signals to respective first and second input channels of the first oscilloscope;

determining, at an adjustment rate of the phase locking of the timebase oscillators, a frequency and phase difference between the first and second clock signals applied to the respective first and second input channels of the first oscilloscope; and

tuning the output frequency of the timebase reference oscillator of at least one of the first and second oscilloscopes based on the determined frequency and phase difference.

6 . The method of claim 5 , wherein the frequency and phase difference is determined in software resident in the first oscilloscope.

7 . The method of claim 5 , wherein the frequency and phase difference is determined in software resident in an external controller connected to the first oscilloscope.

8 . The method of claim 1 , wherein each of the first and second oscilloscopes includes a clock input and a clock output configured for ganging together the first and second oscilloscopes, and a phase detector circuit coupled to the clock input and the clock output, and

wherein phase-locking the timebase reference oscillators includes:

applying the clock output of the second oscilloscope to the clock input of the first oscilloscope;

using the phase detector circuit of the first oscilloscope to detect a frequency and phase difference between the second clock signal of the second oscilloscope and an internal first clock signal of the first oscilloscope; and

tuning an output frequency of the timebase reference oscillator of at least one of the first and second oscilloscopes based on the determined frequency and phase difference,

wherein the first clock signal is synchronized with the timebase reference signal output by the timebase reference oscillator of the first oscilloscope, and the second clock signal is synchronized with the timebase reference clock signal output by the timebase reference oscillator of the second oscilloscope.

9 . The method of claim 8 , wherein at least one of the phase detection, loop filtering or frequency control of the effective phase-locked loop is implemented using a field programmable gate array (FPGA) of the first oscilloscope.

10 . The method of claim 1 , wherein the first oscilloscope includes a timebase (TB) reference signal input, an analog phase detector selectively connected to TB reference signal input, and an analog feedback control,

wherein phase-locking the timebase reference oscillators includes:

applying the timebase reference clock signal of the second oscilloscope to the TB reference signal input of the first oscilloscope;

using the analog phase detector to determine a phase difference between the timebase reference clock signal applied to the TB reference signal input and the timebase reference clock signal output by the timebase reference oscillator of the first oscilloscope; and

tuning an output frequency of the timebase reference oscillator of the first oscilloscope using the feedback control based on the determined phase difference.

11 . A system for measuring the phase jitter and phase noise of a signal-under-test (SUT), the system comprising:

first and second oscilloscopes each having a timebase reference oscillator, the timebase reference oscillator of each of the first and second oscilloscopes configured to generate a timebase reference signal of a given output frequency;

wherein the timebase reference oscillators of the first and second oscilloscopes are phase-locked together;

wherein an input channel of the first oscilloscope and to an input channel of the second oscilloscope are each configured to receive the SUT;

wherein the first oscilloscope is configured to generate a first phase jitter measurement of the SUT and the second oscilloscope is configured to generate a second phase jitter measurement of the SUT; and

wherein the phase jitter and phase noise of the SUT corresponds to a cross-correlation of the first and second phase jitter measurements.

12 . The system of claim 11 , wherein an adjustment update rate of the phase-locked timebase oscillators is below a lowest intended offset frequency content of the phase jitter and phase noise measurements.

13 . The system of claim 11 , wherein an adjustment update rate of the phase-locked timebase oscillators is 1 Hz or less.

14 . The system of claim 11 , wherein phase-locking of the timebase reference oscillators includes:

wherein the first oscilloscope is configured to output a first clock signal synchronized with the timebase reference signal of the first oscilloscope;

wherein the second oscilloscope is configured to output a second clock signal synchronized with the timebase reference signal of the second oscilloscope;

wherein the first and second clock signals are applied to respective first and second input channels of the first oscilloscope;

wherein the system includes software configured to determine, at an adjustment rate of the phase locking of the timebase oscillators, a frequency and phase difference between the first and second clock signals applied to the respective first and second input channels of the first oscilloscope; and

and wherein the output frequency of the timebase reference oscillator of at least one of the first and second oscilloscopes is tuned based on the determined frequency and phase difference.

15 . The system of claim 14 , wherein the software is resident in the first oscilloscope.

16 . The system of claim 14 , wherein the software resident in an external controller connected to the first oscilloscope.

17 . The system of claim 11 , wherein each of the first and second oscilloscopes includes a clock input and a clock output configured for ganging together the first and second oscilloscopes, and a phase detector circuit coupled to the clock input and the clock output, and

wherein the clock output of the second oscilloscope is applied to the clock input of the first oscilloscope;

wherein the phase detector circuit of the first oscilloscope is configured to detect a frequency and phase difference between the second clock signal of the second oscilloscope and an internal first clock signal of the first oscilloscope; and

wherein an output frequency of the timebase reference oscillator of at least one of the first and second oscilloscopes is tuned based on the determined frequency and phase difference.

18 . The system of claim 11 , wherein at least one of the phase detection, loop filtering or frequency control of the effective phase-locked loop are implemented within a field programmable gate array (FPGA) of the first oscilloscope.

19 . The system of claim 11 , wherein the first oscilloscope includes a timebase (TB) reference signal input, an analog phase detector selectively connected to TB reference signal input, and an analog feedback control,

wherein the timebase reference clock signal of the second oscilloscope is applied to the TB reference signal input of the first oscilloscope;

wherein the analog phase detector is configured to determine a phase difference between the timebase reference clock signal applied to the TB reference signal input and the timebase reference clock signal output by the timebase reference oscillator of the first oscilloscope; and

wherein an output frequency of the timebase reference oscillator of the first oscilloscope is tuned using the analog feedback control based on the determined phase difference.

20 . A method for measuring the phase jitter and phase noise of a signal-under-test (SUT), comprising:

providing first and second oscilloscopes each having a timebase reference oscillator, the timebase reference oscillator of each of the first and second oscilloscopes configured to generate a timebase reference signal of a given output frequency;

phase-locking the timebase reference oscillators of the first and second oscilloscopes together;

applying the SUT to an input channel of the first oscilloscope and to an input channel of the second oscilloscope;

generating a first phase jitter measurement of the SUT using the first oscilloscope and generating a second phase jitter measurement of the SUT using the second oscilloscope; and

obtaining the phase jitter and phase noise of the SUT from the first and second phase jitter measurements,

wherein obtaining the phase jitter and phase noise of the SUT comprises cross-correlating the first and second phase jitter measurements to obtain the cross-correlated phase jitter and phase noise of the SUT.