IP Library Granted Patent US 12710460
Granted Patent B2
US 12710460 · App. 18/684,882 · Granted Aug 18, 2026

Electromagnetically induced grating-based electric field detection system and method

Inventors: In Ho Bae (Daejeon, KR); Seon Do Lim (Daejeon, KR); No Weon Kang (Daejeon, KR)
Assignee: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE
G01R29/0885G01R29/12
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Quick Facts
Patent No.
US 12710460
App. No.
18/684,882
Granted
Aug 18, 2026
Kind
B2
Abstract

An electromagnetically induced grating-based electric field detection system and method are provided, which enable the creation of an electromagnetically induced transparency grating using a low-wavelength laser and enables real-time electromagnetic wave measurement by avoiding the frequency reprocessing of the signal that is essential in the existing Rydberg atom-based electric field measurement technology. The detection system may include a vapor cell; an irradiation light source which irradiates irradiation light to be incident on the vapor cell; a combined light source which irradiates combined light to be incident on the vapor cell; a reflector which reflects the combined light that has passed through the vapor cell and makes it incident on the vapor cell; an electromagnetic wave generator which generates an electromagnetic wave to be incident on one side surface of the vapor cell; and a reflected light detector which detects a reflected light released from the vapor cell.

Claims (30)

1 . An electromagnetically induced grating-based electric field detection system comprising:

a vapor cell;

an irradiation light source configured to irradiate irradiation light to be incident on one end of the vapor cell;

a combined light source configured to irradiate combined light to be incident on another end of the vapor cell;

a reflector configured to reflect the combined light that has passed through the vapor cell and to direct the reflected combined light to be incident on the one end of the vapor cell;

an electromagnetic wave generator configured to generate an electromagnetic wave to be incident on one side surface of the vapor cell; and

a reflected light detector configured to detect reflected light released from the vapor cell,

wherein the reflector is disposed such that the combined light that has passed through the vapor cell is reflected and the reflected combined light is incident on the vapor cell in a direction opposite to a direction of travel of the combined light before being reflected, thereby forming a standing wave of the combined light in the vapor cell, and

wherein an angle at which the irradiation light is incident on the vapor cell is adjustable such that reflected light is released from the vapor cell.

2 . The electromagnetically induced grating-based electric field detection system of claim 1 , wherein the combined light has a wavelength in a range from 479 nm to 489 nm.

3 . The electromagnetically induced grating-based electric field detection system of claim 1 , further comprising:

a dichroic mirror disposed between the one end of the vapor cell and the reflector, the dichroic mirror being configured to allow the combined light that has passed through the vapor cell to pass therethrough.

4 . The electromagnetically induced grating-based electric field detection system of claim 1 , further comprising:

a collimator configured to convert the irradiation light or the combined light incident on the vapor cell into parallel light.

5 . The electromagnetically induced grating-based electric field detection system of claim 1 , wherein the reflected light detector includes:

a measuring part of reflected light configured to measure the intensity of the reflected light released from the vapor cell;

a calculating part of an amount of change of reflected light configured to calculate the amount of change in the reflected light caused by the electromagnetic wave incident on the vapor cell; and

an electromagnetic wave calculating part configured to calculate the intensity and phase of the electromagnetic wave incident on the vapor cell based on the amount of change in the reflected light.

6 . An electromagnetically induced grating-based electric field detection method comprising:

generating an electromagnetically induced transparency signal in which irradiation light and combined light are incident on a vapor cell in opposite directions to generate a Rydberg electromagnetically induced transparency signal;

generating a standing wave in which the combined light that has passed through the vapor cell is reflected through a reflector, so that the reflected combined light is incident on the vapor cell to generate a standing wave;

generating reflected light in which the reflected light is released from the vapor cell by adjusting an angle at which the irradiation light is incident on the vapor cell; and

calculating an electromagnetic wave in which the electromagnetic wave is incident on the vapor cell through an electromagnetic wave generator, and then, based on an amount of change in the reflected light caused by the incident electromagnetic wave, the intensity and phase of the electromagnetic wave are calculated.

7 . The electromagnetically induced grating-based electric field detection method of claim 6 , wherein the wavelength of the combined light is in a range from 479 nm to 489 nm.

8 . The electromagnetically induced grating-based electric field detection method of claim 6 , wherein in the step of generating the standing wave, the combined light passes through a dichroic mirror and then is reflected using the reflector.

9 . The electromagnetically induced grating-based electric field detection method of claim 6 , wherein the step of calculating the electromagnetic wave includes:

measuring the reflected light released from the vapor cell through a measuring part of reflected light;

allowing an electromagnetic wave to be incident on the vapor cell through the electromagnetic wave generator;

calculating the amount of change in the reflected light caused by the electromagnetic wave incident on the vapor cell through a calculating part of change amount; and

calculating the intensity and phase of the electromagnetic wave based on the amount of change in the reflected light through an electromagnetic wave calculating part.