IP Library Granted Patent US 12710485
Granted Patent B2
US 12710485 · App. 19/229,609 · Granted Aug 18, 2026

Monitoring technology for active optical components

Inventors: Jerome D. Taylor (Prior Lake, MN); Scott Blanc (Bemidji, MN); Carl Snyder (Bloomington, MN); Brandon Lee Magnan (Crystal, MN)
Assignee: NORTECH SYSTEMS, INC.
G01R31/67G01R31/69
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Quick Facts
Patent No.
US 12710485
App. No.
19/229,609
Granted
Aug 18, 2026
Kind
B2
Abstract

A diagnostic monitoring device contains a diagnostic monitor circuit configured to monitor analog diagnostic monitoring information, and configured to convert the analog diagnostic monitoring information to digital diagnostic monitoring information, the diagnostic monitor circuit comprising a first clock or a first oscillator. The diagnostic monitoring device further contains a microcontroller comprising a register map, wherein the microcontroller is configured to receive the digital diagnostic monitoring information, store the digital diagnostic monitoring information in the register map, and provide a clock disable command to the diagnostic monitor circuit. The microcontroller further comprises a communications link for communicating with an external system external to the diagnostic monitoring device. The diagnostic monitor circuit is configured to receive a clock disable command from the microcontroller, and in response to receiving the clock disable command, the diagnostic monitor circuit is configured to disable the first clock or the first oscillator.

Claims (16)

1 . A diagnostic monitoring device comprising:

a diagnostic monitor circuit within a cable, and configured to monitor analog diagnostic monitoring information, and configured to convert the analog diagnostic monitoring information to digital diagnostic monitoring information, the diagnostic monitor circuit comprising a first clock or a first oscillator;

a microcontroller within the cable, and comprising a register map, wherein the microcontroller is configured to:

receive the digital diagnostic monitoring information;

store the digital diagnostic monitoring information in the register map;

generate a clock disable command in response to an instruction received from an external system; and

transmit the clock disable command to the diagnostic monitor circuit;

wherein the microcontroller further comprises a communications link for communicating with the external system external to the diagnostic monitoring device;

wherein the diagnostic monitor circuit is configured to receive a clock disable command from the microcontroller, and in response to receiving the clock disable command, the diagnostic monitor circuit being configured to disable the first clock or the first oscillator for at least a predefined period of time, thereby ceasing operation of the diagnostic monitor circuit.

2 . The diagnostic monitoring device of claim 1 , wherein the clock disable command is a clock disable signal.

3 . The diagnostic monitoring device of claim 2 , wherein the diagnostic monitoring circuit is further configured to receive a clock enable command, the clock enable command configured to enable the first clock or the first oscillator.

4 . The diagnostic monitoring device of claim 3 , wherein the microcontroller further comprises a second clock and wherein the clock disable command is further configured to disable the second clock.

5 . The diagnostic monitoring device of claim 4 , wherein, in accordance with the clock disable command, the second clock is re-enabled after a pre-defined timed delay, without receiving a separate clock enable command.

6 . The diagnostic monitoring device of claim 1 , wherein the instruction received from the external system via the communications link is to disable the first clock of the diagnostic monitor circuit.

7 . The diagnostic monitoring device of claim 1 , wherein the analog diagnostic monitoring information comprises at least one of receiving power, transmitting power, BIAS current, supply voltage, temperature, ingress optical power monitoring, and soft controls.

8 . The diagnostic monitoring device of claim 1 , wherein the diagnostic monitor circuit is configured to monitor one or more electrical characteristics of an associated device based on diagnostic monitoring information received at the diagnostic monitor circuit.