Memory bandwidth aggregation using simultaneous access of stacked semiconductor memory die
A packaged semiconductor device includes a data pin, a first memory die, and a second memory die stacked with the first memory die. The first memory die includes a first data interface coupled to the data pin and a first memory core having a plurality of banks. The second memory die includes a second memory core having a plurality of banks. A respective bank of the first memory core and a respective bank of the second memory core perform parallel row access operations in response to a first command signal and parallel column access operations in response to a second command signal. The first data interface of the first die provides aggregated data from the parallel column access operations in the first and second die to the data pin.
1 . A memory device, comprising:
a first memory die coupled to a data pin and including a first storage array;
a second memory die stacked with the first memory die and including a second storage array;
in response to a read command, the first storage array and the second storage array to perform parallel read access operations to access disaggregated read data;
serialization circuitry to serialize the disaggregated read data into aggregated read data; and
wherein the data pin is to transmit the aggregated read data in the form of serialized read data to a memory controller.
2 . The memory device according to claim 1 , wherein:
the data pin transmits the serialized read data at a first data rate; and
the serialization circuitry is to receive the disaggregated read data as a first read data portion and a second read data portion at a second data rate that is less than the first data rate.
3 . The memory device according to claim 2 , wherein:
the second data rate is half the first data rate.
4 . The memory device according to claim 2 , wherein:
the first read data portion and the second read data portion comprise alternating bits of the disaggregated read data.
5 . The memory device according to claim 1 , wherein:
the first memory die includes first interface circuitry to communicate with the second memory die over at least one through-silicon-via (TSV); and
wherein the first interface circuitry, in response to the read command, accesses the second storage array over the TSV.
6 . The memory device according to claim 1 , wherein:
the data pin is bidirectional.
7 . The memory device according to claim 1 , wherein:
the first memory die comprises a first dynamic random access memory (DRAM) die; and;
the second memory die comprises a second DRAM die.
8 . A method of operation in a memory device, the memory device having a data pin, a first memory die coupled to the data pin, and a second memory die stacked with the first memory die, the method comprising:
performing parallel read access operations to the first memory die and the second memory die to access disaggregated read data in response to receiving a read command;
serializing the disaggregated read data into serialized aggregated read data; and
transmitting, with the data pin, the serialized aggregated read data to a memory controller.
9 . The method of claim 8 , wherein:
transmitting of the serialized aggregated read data by the data pin is carried out at a first data rate; and
performing parallel read access operations accesses the disaggregated read data as a first unserialized portion of the disaggregated read data and a second unserialized portion of the disaggregated read data at a second data rate that is less than the first data rate.
10 . The method of claim 9 , wherein:
the second data rate is half the first data rate.
11 . The method of claim 9 , wherein:
the first unserialized portion of the aggregated read data and the second unserialized portion of the aggregated read data comprise alternating bits of the disaggregated read data.
12 . The method of claim 9 , further comprising:
communicating, using the first memory die, with the second memory die over at least one through-silicon-via (TSV); and
transferring, in response to the read command, a second portion of the disaggregated read data to the first memory die over the at least one TSV.
13 . The method of claim 8 , wherein:
performing parallel read access operations to the first memory die and the second memory die is carried out in accordance with a dynamic random access memory (DRAM) protocol.
14 . A dynamic random access memory (DRAM) device, comprising:
multiple DRAM memory die stacked in a vertical relationship, the multiple DRAM memory die having multiple storage arrays;
in response to receiving a read command, the multiple storage arrays to perform parallel read access operations to access disaggregated read data;
serialization circuitry to serialize the disaggregated read data into serialized read data; and
a data pin to transmit the serialized read data to a memory controller.
15 . The DRAM device according to claim 14 , wherein:
the multiple DRAM memory die are formed with at least one through-silicon-via; and
interface circuitry of one of the multiple DRAM memory die, in response to receiving the read command, is to access at least one of the multiple storage arrays of at least one of the other multiple DRAM memory die over the at least one TSV.
16 . The DRAM device according to claim 14 , wherein:
the data pin transmits the serialized read data at a first data rate; and
the serialization circuitry is to receive the disaggregated read data as a first portion of the disaggregated read data and a second portion of the disaggregated read data at a second data rate that is less than the first data rate.
17 . The DRAM device according to claim 16 , wherein:
the second data rate is half the first data rate.
18 . The DRAM device according to claim 16 , wherein:
the first portion of the disaggregated read data and the second portion of the disaggregated read data comprise alternating bits of the disaggregated read data.
19 . The DRAM device according to claim 18 , wherein:
the data pin is bidirectional.
20 . The DRAM device according to claim 19 , wherein:
the serialization circuitry includes respective serialization circuits in each of the multiple DRAM memory die.