IP Library Granted Patent US 12712014
Granted Patent B2
US 12712014 · App. 18/911,271 · Granted Aug 18, 2026

Vertical memory device with a double word line structure

Inventors: Seung-Hwan Kim (Seoul, KR); Su-Ock Chung (Seoul, KR); Seon-Yong Cha (Chungcheongbuk-do, KR)
Assignee: SK hynix Inc.
G11C11/4097G11C7/18G11C11/401H10B12/30
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Quick Facts
Patent No.
US 12712014
App. No.
18/911,271
Granted
Aug 18, 2026
Kind
B2
Abstract

A memory device includes: a substrate; a bit line which is vertically oriented from the substrate; a plate line which is vertically oriented from the substrate; and a memory cell provided with a transistor and a capacitor that are positioned in a lateral arrangement between the bit line and the plate line, wherein the transistor includes: an active layer which is laterally oriented to be parallel to the substrate between the bit line and the capacitor; and a line-shaped lower word line and a line-shaped upper word line vertically stacked with the active layer therebetween and oriented to intersect with the active layer.

Claims (26)

1 . A memory device, comprising:

a memory cell array including a plurality of memory cells,

wherein each of the memory cells comprises:

a capacitor comprising a lateral cylindrical shaped structure;

an active layer coupled to the capacitor; and

a pair of word lines comprising a lower word line disposed under the active layer and an upper word line disposed over the active layer.

2 . The memory device of claim 1 , wherein the memory cell comprising at least one gate dielectric layer individually disposed between upper and lower surfaces of the active layer and the lower and the upper word lines.

3 . The memory device of claim 2 , wherein the at least one gate dielectric layer surrounds the active layer.

4 . The memory device of claim 2 , wherein the at least one gate dielectric layer is disposed on top of the upper and lower surfaces of the active layer.

5 . The memory device of claim 2 , wherein the lower word line and the upper word line is disposed on top of the at least one gate dielectric layer.

6 . The memory device of claim 1 , wherein the lower word line and the upper word line have a line-shaped structure.

7 . The memory device of claim 1 , wherein the upper word line and the lower word line are electrically connected to each other.

8 . The memory device of claim 1 , wherein the memory cell array comprises a bit line electrically connected to the active layer, the bit line vertically oriented from a substrate.

9 . The memory device of claim 1 , further comprising:

a peripheral circuit portion for controlling the memory cell array.

10 . The memory device of claim 9 , further comprising:

a plurality of bonding pads,

wherein the memory cell array and the peripheral circuit portion are electrically connected to each other through the bonding pads.

11 . The memory device of claim 1 , wherein the capacitor includes:

a first node coupled to the active layer;

a second node over the first node; and

a dielectric material between the first node and the second node.

12 . The memory device of claim 11 , wherein the first node of the capacitor has a lateral cylindrical shape.

13 . The memory device of claim 12 , wherein the second node of the capacitor includes:

an inner second node extending into the cylindrical shape of the first node; and

a plurality of outer second nodes surrounding an outside of the cylindrical shape of the first node.