IP Library Granted Patent US 12712155
Granted Patent B2
US 12712155 · App. 18/133,216 · Granted Aug 18, 2026

PEALD titanium nitride with direct microwave plasma

Inventors: Hanhong Chen (Milpitas, CA); Arkaprava Dan (San Jose, CA); Joseph AuBuchon (San Jose, CA); Kyoung Ha Kim (Cupertino, CA); Philip A. Kraus (San Jose, CA)
Assignee: Applied Materials, Inc.
H01J37/32201C23C16/34C23C16/511H10P14/418H10W20/032H01J2237/3321
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Quick Facts
Patent No.
US 12712155
App. No.
18/133,216
Granted
Aug 18, 2026
Kind
B2
Abstract

A method of depositing titanium nitride is disclosed. Some embodiments of the disclosure provide a PEALD process for depositing titanium nitride which utilizes a direct microwave plasma. In some embodiments, the direct microwave plasma has a high plasma density and low ion energy. In some embodiments, the plasma is generated directly above the substrate surface.

Claims (7)

1 . A method of depositing titanium nitride, the method comprising sequentially exposing a substrate surface to a titanium precursor and a direct microwave plasma generated from a plasma gas by one or more microwave sources, wherein a distance between the one or more microwave sources and the substrate surface is less than or equal to 50 mm.

2 . The method of claim 1 , wherein the direct microwave plasma is generated within 20 mm of the substrate surface.

3 . The method of claim 1 , wherein the one or more microwave sources comprises an applicator with a dielectric resonant cavity.

4 . The method of claim 1 , wherein the plasma gas comprises ammonia or nitrogen gas (N 2 ).

5 . The method of claim 4 , wherein the plasma gas further comprises one or more of argon or hydrogen.

6 . The method of claim 1 , wherein a power delivered by the one or more microwave sources to the plasma gas is greater than or equal to 500 W.

7 . The method of claim 1 , wherein the substrate surface is maintained at a temperature of less than or equal to 600° C.