IP Library Granted Patent US 12712522
Granted Patent B2
US 12712522 · App. 18/405,300 · Granted Aug 18, 2026

Embedded capacitors with buried metal layer underneath bulk acoustic wave resonator for electromechanical coupling coefficient control

Inventors: Kwang Jae Shin (Yongin, KR); Xiangnan Pang (Irvine, CA); Jae Hyung Lee (Seoul, KR); Taecheol Shon (Hwaseong, KR)
Assignee: SKYWORKS GLOBAL PTE. LTD.
H03H9/173H03H9/542H03H9/568
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Quick Facts
Patent No.
US 12712522
App. No.
18/405,300
Granted
Aug 18, 2026
Kind
B2
Abstract

Aspects and embodiments disclosed herein include a film bulk acoustic wave resonator comprising a substrate including a layer of dielectric material disposed on an upper surface of the substrate, a layer of piezoelectric material, a top electrode disposed on a top surface of the layer of piezoelectric material, a bottom electrode disposed on a bottom surface of the layer of piezoelectric material, a cavity defined between a lower surface of the bottom electrode and an upper surface of the layer of dielectric material, and a layer of conductive material buried within the layer of dielectric material at least partially beneath the cavity and the bottom electrode.

Claims (30)

1 . A film bulk acoustic wave resonator comprising:

a substrate including a layer of dielectric material disposed on an upper surface of the substrate;

a layer of piezoelectric material;

a top electrode disposed on a top surface of the layer of piezoelectric material;

a bottom electrode disposed on a bottom surface of the layer of piezoelectric material, a cavity defined between a lower surface of the bottom electrode and an upper surface of the layer of dielectric material; and

a layer of conductive material buried within the layer of dielectric material and disposed beneath only a portion of the cavity and the bottom electrode.

2 . The film bulk acoustic wave resonator of claim 1 wherein at least a portion of an upper surface of the layer of conductive material is disposed beneath the upper surface of the layer of dielectric material.

3 . The film bulk acoustic wave resonator of claim 2 wherein at least a portion of a lower surface of the layer of conductive material is disposed above a lower surface of the layer of dielectric material.

4 . The film bulk acoustic wave resonator of claim 1 wherein the layer of conductive material is electrically connected to the top electrode.

5 . The film bulk acoustic wave resonator of claim 4 wherein a portion of the layer of conductive material extends outward from an area beneath the cavity and electrically connects to a top electrical contact that is electrically connected to the top electrode.

6 . The film bulk acoustic wave resonator of claim 4 further comprising a through-substrate via passing through the substrate and electrically connecting the layer of conducting material to an electrical contact disposed on a lower surface of the substrate.

7 . The film bulk acoustic wave resonator of claim 1 wherein the layer of conductive material is electrically connected to neither the top electrode nor the bottom electrode.

8 . The film bulk acoustic wave resonator of claim 7 wherein the layer of conductive material is electrically floating.

9 . The film bulk acoustic wave resonator of claim 7 wherein the layer of conductive material is disposed entirely beneath the cavity.

10 . The film bulk acoustic wave resonator of claim 7 further comprising a through-substrate via passing through the substrate and electrically connecting the layer of conducting material to an electrical contact disposed on a lower surface of the substrate.

11 . The film bulk acoustic wave resonator of claim 1 wherein the layer of conductive material is electrically connected to the bottom electrode.

12 . The film bulk acoustic wave resonator of claim 11 wherein the layer of conductive material is directly connected to the bottom electrode.

13 . The film bulk acoustic wave resonator of claim 11 further comprising a through-substrate via passing through the substrate and electrically connecting the layer of conducting material to an electrical contact disposed on a lower surface of the substrate.

14 . The film bulk acoustic wave resonator of claim 1 wherein the layer of conductive material changes an electromechanical coupling coefficient of the film bulk acoustic wave resonator.

15 . The film bulk acoustic wave resonator of claim 1 wherein the layer of conductive material lowers an electromechanical coupling coefficient of the film bulk acoustic wave resonator.

16 . The film bulk acoustic wave resonator of claim 1 wherein the layer of conductive material defines a first plate of a capacitor and one of the top electrode or the bottom electrode defines a second plate of the capacitor.

17 . A ladder filter including a series arm film bulk acoustic wave resonator comprising:

a substrate including a layer of dielectric material disposed on an upper surface of the substrate;

a layer of piezoelectric material;

a top electrode disposed on a top surface of the layer of piezoelectric material;

a bottom electrode disposed on a bottom surface of the layer of piezoelectric material, a cavity defined between a lower surface of the bottom electrode and an upper surface of the layer of dielectric material; and

a layer of conductive material buried within the layer of dielectric material and disposed beneath only a portion of the cavity and bottom electrode.

18 . The ladder filter of claim 17 further comprising a capacitor electrically connected in parallel to the series arm film bulk acoustic wave resonator.

19 . The ladder filter of claim 18 wherein the layer of conductive material defines a first plate of the capacitor and one of the top electrode or the bottom electrode defines a second plate of the capacitor.

20 . An electronic device including the ladder filter of claim 19 .