IP Library Granted Patent US 12712581
Granted Patent B2
US 12712581 · App. 18/397,714 · Granted Aug 18, 2026

Semiconductor device

Inventors: Wataru Saito (Tokyo, JP); Fukashi Morishita (Tokyo, JP)
Assignee: Renesas Electronics Corporation
H04B1/1027H04B1/40
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Quick Facts
Patent No.
US 12712581
App. No.
18/397,714
Granted
Aug 18, 2026
Kind
B2
Abstract

The circuit area of the semiconductor device in which the transmission period and the reception period are alternately repeated is reduced. The semiconductor device includes a transmission circuit and a receiving circuit. The receiving circuit includes a gain control circuit that samples the input signal to adjust the gain of the receiving circuit during the reception period and adjusts the gain based on the sampling result during the transmission period.

Claims (24)

1 . A semiconductor device comprising:

a transmission circuit configured to output an analog signal; and

a receiving circuit configured to receive an input signal which is transmitted from a target object in response to the analog signal,

wherein the semiconductor device operates by alternately repeating a transmission period that to transmit the analog signal and a reception period that to receive the input signal,

wherein the receiving circuit comprises a gain control circuit configured to sample the input signal during the reception period, and to control a gain of the receiving circuit based on the sampled input signal during the transmission period,

wherein the gain control circuit comprises:

a gain adjustment circuit configured to amplify the input signal according to the gain, and

an analog-to-digital converting circuit configured to analog-to-digital convert the amplified input signal,

wherein the gain adjustment circuit comprises:

a threshold detection circuit configured to detect an amplitude information related to an amplitude of the input signal;

a setting control circuit configured to set the gain during the transmission period; and

an output circuit configured to output the gain set by the setting control circuit, and

wherein the threshold circuit comprises:

a holding circuit configured to hold the amplitude information during the reception period; and

a reset circuit configured to reset the amplitude information when the reception period finishes.

2 . The semiconductor device according to claim 1 , wherein the threshold detection circuit and the gain adjustment circuit are disposed near the receiving circuit than the analog-to-digital conversion circuit in the gain control circuit.

3 . The semiconductor device according to claim 1 ,

wherein the analog-to-digital conversion circuit comprises a sample-and-hold circuit and a voltage comparation circuit, and is activated while the amplitude information is held during the reception period.

4 . The semiconductor device according to claim 1 , wherein the analog-to-digital conversion circuit comprises a plurality of sample-and-hold circuits and a plurality of voltage comparation circuits,

wherein the plurality of the sample-and-hold circuit sample the amplified input signal at different timings, and

wherein the analog-to-digital conversion circuit is activated while the gain is not adjusted during the transmission period.

5 . The semiconductor device according to claim 1 ,

wherein the analog-to-digital conversion circuit comprises a plurality of sample-and-hold circuits and a plurality of voltage comparation circuits, and

wherein the plurality of the voltage comparation circuits inputs a reference voltage, and are configured to control an amplitude or its absolute value of the reference voltage based on the amplitude information.