IP Library Granted Patent US 12,713,579
Granted Patent B2
US 12,713,579 · App. 18/492,789 · Granted Aug 18, 2026

Memory cell and memory device

Inventors: Seung Hwan Kim (Gyeonggi-do, KR); Dong Sun Sheen (Gyeonggi-do, KR); Su Ock Chung (Gyeonggi-do, KR); Il Sup Jin (Gyeonggi-do, KR); Seon Yong Cha (Gyeonggi-do, KR)
Assignee: SK hynix Inc.
H10B12/30
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Quick Facts
Patent No.
US 12,713,579
App. No.
18/492,789
Filed
Oct 24, 2023
Granted
Aug 18, 2026
Kind
B2
Examiner
LIN, JOHN
Art Unit
2815
USPC
257/296
Abstract

A memory cell includes: a substrate; an active layer spaced apart from a surface of the substrate and extending in a direction which is parallel to the surface of the substrate; a bit line coupled to one side of the active layer and extending in a direction perpendicular to the surface of the substrate; a capacitor coupled to another side of the active layer and spaced apart from the surface of the substrate; and a word line vertically spaced apart from the active layer and extending in a direction intersecting with the active layer, wherein the word line includes a first notch-shaped sidewall and a second notch-shaped sidewall that face each other.

Claims (25)

1 . A memory cell, comprising:

a substrate;

an active layer spaced apart from a surface of the substrate and including a channel extending in a direction which is parallel to the surface of the substrate;

a bit line coupled to one side of the active layer and extending in a direction perpendicular to the surface of the substrate;

a capacitor coupled to another side of the active layer and spaced apart from the surface of the substrate; and

a word line vertically spaced apart from the active layer and extending in a direction crossing the active layer,

wherein the channel of the active layer includes round sidewalls having protrusions vertically overlapping with the word line.

2 . The memory cell of claim 1 , wherein the channel includes:

a first round sidewall having a first protrusion; and

a second round sidewall having a second protrusion,

wherein the first round sidewall and the second round sidewall face each other in a direction that the word line extends.

3 . The memory cell of claim 2 , wherein the first round sidewall includes first round sub-sidewalls that are symmetrical to each other with the first protrusion therebetween, and

the second round sidewall includes second round sub-sidewalls that are symmetrical to each other with the second protrusion therebetween.

4 . The memory cell of claim 1 , wherein the word line includes a first notch-shaped sidewall and a second notch-shaped sidewall facing each other.

5 . The memory cell of claim 4 , wherein each of the first notch-shaped sidewall and the second notch-shaped sidewall includes a plurality of flat surfaces and a plurality of recessed surfaces.

6 . The memory cell of claim 5 , wherein the flat surfaces and the recessed surfaces alternate in the direction that the word line extends.

7 . The memory cell of claim 6 , wherein the flat surfaces are adjacent to the bit line.

8 . The memory cell of claim 6 , wherein the recessed surfaces include a hemispherical notch shape, a triangular notch shape, or a rectangular notch shape.

9 . The memory cell of claim 4 , further comprising:

a dielectric supporter supporting each of the first notch-shaped sidewall and the second notch-shaped sidewall of the word line.

10 . The memory cell of claim 1 , wherein the word line has a double word line structure in which two word lines vertically face each other with the active layer interposed therebetween.

11 . The memory cell of claim 1 , wherein the word line includes a notch-shaped word line and a notch-shaped shield word line that vertically face each other with the active layer interposed therebetween.

12 . The memory cell of claim 1 , wherein the word line includes a first notch-shaped sidewall and a second notch-shaped sidewall that face each other,

wherein each of the first notch-shaped sidewall and the second notch-shaped sidewall includes a plurality of flat surfaces and a plurality of recessed surfaces, and

wherein a distance between the flat surfaces and the bit line is shorter than a distance between the recessed surfaces and the bit line.