IP Library Granted Patent US 12713610
Granted Patent B2
US 12713610 · App. 18/437,604 · Granted Aug 18, 2026

Three-dimensional semiconductor memory device and electronic system including the same

Inventors: Joonyoung Kwon (Suwon-si, KR); Jiyoung Kim (Suwon-si, KR); Junhyoung Kim (Suwon-si, KR); Sukkang Sung (Suwon-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H10B43/27H10B41/10H10B41/27H10B41/35H10B41/40H10B43/10H10B43/35H10B43/40H10B80/00H10W20/435H10W90/00H10W90/752
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Quick Facts
Patent No.
US 12713610
App. No.
18/437,604
Granted
Aug 18, 2026
Kind
B2
Abstract

The present disclosure relates to three-dimensional (3D) semiconductor memory devices and electronic systems. An example 3D semiconductor memory device comprises a peripheral circuit structure on a peripheral substrate, a stack structure that includes a plurality of gate electrodes stacked on the peripheral circuit structure, an n-doped pattern on the stack structure, a vertical structure that extends through the stack structure into the n-doped pattern, a p-doped pattern on the n-doped pattern, and an undoped pattern between the n-doped pattern and then p-doped pattern. The p-doped pattern includes a p-doped horizontal pattern on the undoped pattern, and a p-doped vertical pattern that extends through the undoped pattern and the n-doped pattern and that contacts with the vertical structure.

Claims (63)

1 . A three-dimensional semiconductor memory device comprising:

a circuit structure on a substrate;

a stack structure that includes a plurality of gate electrodes stacked on the circuit structure;

an n-doped pattern on the stack structure;

a vertical structure that extends through the stack structure into the n-doped pattern;

a p-doped pattern on the n-doped pattern; and

an undoped pattern between the n-doped pattern and then p-doped pattern,

wherein the p-doped pattern includes:

a p-doped horizontal pattern on the undoped pattern; and

a p-doped vertical pattern that extends through the undoped pattern and the n-doped pattern and that contacts with the vertical structure.

2 . The device of claim 1 , wherein the undoped pattern vertically separates the p-doped horizontal pattern from the n-doped pattern.

3 . The device of claim 1 , wherein the undoped pattern covers a top surface of the n-doped pattern.

4 . The device of claim 1 , wherein

the stack structure includes a plurality of structures that are horizontally spaced apart from each other, and

the device comprises a separation structure that separates the plurality of structures from each other and that extends into the n-doped pattern.

5 . The device of claim 4 , wherein the separation structure includes:

a metal contact electrically connected to the n-doped pattern; and

a separation dielectric pattern between the metal contact and the stack structure.

6 . The device of claim 1 , comprising a metal contact that extends through the p-doped pattern and the undoped pattern into the n-doped pattern.

7 . The device of claim 1 , wherein a doping concentration of the n-doped pattern increases continuously or discontinuously in a downward direction.

8 . The device of claim 1 , wherein a doping concentration of the p-doped horizontal pattern decreases continuously or discontinuously in a downward direction.

9 . The device of claim 1 , wherein

an upper portion of the p-doped vertical pattern is surrounded by the undoped pattern, and

a lower portion of the p-doped vertical pattern is surrounded by the n-doped pattern.

10 . The device of claim 9 , wherein, in a plan view, a doping concentration at the upper portion of the p-doped vertical pattern decreases continuously or discontinuously with decreasing distance from the undoped pattern.

11 . The device of claim 9 , wherein, in a plan view, a doping concentration at the lower portion of the p-doped vertical pattern decreases continuously or discontinuously with decreasing distance from the n-doped pattern.

12 . The device of claim 1 , comprising a p-contact plug electrically connected to the p-doped pattern,

wherein the p-doped pattern includes an ohmic region adjacent to the p-contact plug, and

wherein the ohmic region includes an n-type impurity.

13 . The device of claim 1 , wherein a width in a horizontal direction of the p-doped vertical pattern decreases in a downward direction.

14 . A three-dimensional semiconductor memory device comprising:

a circuit structure on a substrate;

a stack structure that includes a plurality of gate electrodes stacked on the circuit structure;

an n-doped pattern on the stack structure;

a vertical structure that extends through the stack structure into the n-doped pattern;

an undoped pattern on the n-doped pattern;

a p-doped pattern that extends through the undoped pattern and the n-doped pattern and that contacts with the vertical structure;

a metal contact electrically connected to the n-doped pattern; and

a p-contact plug electrically connected to the p-doped pattern.

15 . The device of claim 14 , wherein the p-doped pattern covers a top surface of the undoped pattern.

16 . The device of claim 14 , wherein the n-doped pattern includes:

a first n-doped region; and

a second n-doped region, wherein a doping concentration of the second n-doped region is less than a doping concentration of the first n-doped region, and

wherein the second n-doped region is closer than the first n-doped region to the undoped pattern.

17 . The device of claim 14 , wherein the p-doped pattern includes:

a first p-doped region; and

a second p-doped region, wherein a doping concentration of the second p-doped region is greater than a doping concentration of the first p-doped region, and

wherein the first p-doped region is closer than the second p-doped region to the undoped pattern.

18 . The device of claim 14 , wherein the metal contact extends into the n-doped pattern from a bottom or top end of the n-doped pattern.

19 . An electronic system comprising:

a three-dimensional semiconductor memory device; and

a controller electrically connected through an input/output pad to the three-dimensional semiconductor memory device, the controller configured to control the three-dimensional semiconductor memory device,

wherein the three-dimensional semiconductor memory device includes:

a circuit structure on a substrate;

a stack structure that includes a plurality of gate electrodes stacked on the circuit structure;

an n-doped pattern on the stack structure;

a vertical structure that extends through the stack structure into the n-doped pattern;

a p-doped pattern on the n-doped pattern; and

an undoped pattern between the n-doped pattern and then p-doped pattern,

wherein the p-doped pattern includes:

a p-doped horizontal pattern on the undoped pattern; and

a p-doped vertical pattern that extends through the undoped pattern and the n-doped pattern and that contacts with the vertical structure.

20 . The electronic system of claim 19 , wherein the undoped pattern vertically separates the p-doped horizontal pattern from the n-doped pattern.