Container for receiving semiconductor device

1 . A container for receiving a semiconductor device, comprising:

an interior space defined by sidewalls of the container;

a first light reflecting coating in the interior space;

a light emitter mounted on an outer surface of a first sidewall of the container, and configured to emit a light from an outside of the interior space into the interior space and toward the first light reflecting coating; and

a detector mounted to an inner surface of a second sidewall of the container, the second sidewall being different from the first sidewall, wherein the detector is configured to detect the light emitted from the light emitter and reflected by the first light reflecting coating.

2 . The container of claim 1 , wherein a position of the light emitter and a position of the detector are fixed.

3 . The container of claim 1 further comprising a second light reflecting coating configured to reflect the light reflected by the first light reflecting coating.

4 . The container of claim 3 , wherein the first light reflecting coating is disposed on a first side of the interior space and the second light reflecting coating is disposed on a second side of the interior space, and wherein the first side of the interior space is opposite to the second side of the interior space.

5 . The container of claim 4 , wherein the light emitted from the light emitter is reflected multiple times between the first side of the interior space and the second side of the interior space.

6 . The container of claim 1 , wherein the second sidewall is perpendicular to the first sidewall.

7 . The container of claim 1 , wherein the light entering the interior space is initially reflected by the first light reflecting coating.

8 . The container of claim 1 , wherein the light emitted from the light emitter has a single wavelength.

9 . The container of claim 1 , wherein the light emitted from the light emitter has multiple wavelengths and the detector comprises a spectrometer.

10 . A container for receiving a semiconductor device, comprising:

an interior space defined by sidewalls of the container;

a light emitter mounted on an outer surface of a first sidewall of the container, wherein the light emitter is configured to emit a light from an outside of the interior space into the interior space;

a detector mounted to an inner surface of a second sidewall of the container, the second sidewall being different from the first sidewall; and

a first light reflecting coating in the interior space and disposed on a surface of a third sidewall of the container, the third sidewall being opposite to the second sidewall,

wherein the light entering the interior space is initially reflected by the first light reflecting coating, thereby directing the light to travel between the third sidewall and the second sidewall before being detected,

wherein the detector is configured to detect the light within the interior space.

11 . The container of claim 10 , wherein the third sidewall is parallel to the second sidewall.

12 . The container of claim 11 , wherein the second sidewall and the third sidewall are connected to two ends of the first sidewall.

13 . The container of claim 10 , wherein the first sidewall comprises a light-transmissive portion configured to allow the light emitted from the light emitter to pass from the outside of the interior space into the interior space.

14 . The container of claim 10 , wherein a distance between the second sidewall and a mounting position of the light emitter on the first sidewall is less than a distance between the third sidewall and the mounting position.

15 . The container of claim 10 , wherein a second light reflecting coating is disposed within the interior space on a surface of the second sidewall of the container.

16 . The container of claim 10 , wherein a travel path of the light, from entering the interior space to reaching the detector, is at least 1.75 times a distance between the third sidewall and the second sidewall.

17 . A container for receiving a semiconductor device, comprising:

an interior space defined by sidewalls of the container and configured to accommodate the semiconductor device, wherein the interior space has a first surface and a second surface facing the first surface;

a light emitter mounted on an outer surface of a first sidewall of the container, and configured to emit light from an outside of the interior space into the interior space;

a detector mounted to an inner surface of a second sidewall of the container, the second sidewall being different from the first sidewall; and

a first light reflecting coating in the interior space and disposed on an inner surface of a third sidewall of the container, the third sidewall being opposite to the second sidewall,

wherein the light is reflected between the first light reflecting coating and a second light reflecting coating disposed on the inner surface of the second sidewall while propagating through the interior space, and

wherein the detector is configured to receive and detect the light after being reflected by the first light reflecting coating and the second light reflecting coating multiple times within the interior space.

18 . The container of claim 17 , wherein the first light reflecting coating is parallel to the second light reflecting coating.

19 . The container of claim 17 , wherein the first light reflecting coating and the second light reflecting coating are continuously extending reflecting coatings, and an extension length of the first light reflecting coating is greater than an extension length of the second light reflecting coating.

20 . The container of claim 17 , wherein the first sidewall comprises a window configured to allow the light emitted from the light emitter to pass from the outside of the interior space into the interior space.