Computing device and electronic device guaranteeing bandwidth per computational performance
A computing device includes: a processor; a memory stack in which memories connected to the processor are stacked; and a substrate disposed under the processor, wherein a memory bandwidth between the processor and the memory stack is five or less times a network bandwidth between the processor and the substrate.
1 . A computing device comprising:
a processor;
a memory stack in which memories connected to the processor are stacked; and
a substrate disposed under the processor,
wherein the processor and the memory stack are connected through a through-silicon via (TSV), and
wherein a memory bandwidth established through the TSV between the processor and the memory stack is five or less times a network bandwidth between the processor and the substrate.
2 . The computing device of claim 1 , wherein
a computational performance of the processor is determined based on an area of the processor, and
the network bandwidth per the computational performance of the processor is greater than or equal to 0.1 bytes per flop.
3 . The computing device of claim 1 , wherein an area of the substrate is five or greater times an area of the processor.
4 . The computing device of claim 1 , wherein
the memory bandwidth is determined based on TSV area present between the processor and the memory stack, and
the network bandwidth is determined based on an input/output (I/O) area of the processor and an area of the substrate.
5 . The computing device of claim 1 , wherein the processor is configured to:
determine the memory bandwidth by controlling a number of TSV connections to the memory stack and a memory signal frequency of the memory stack; and
determine the network bandwidth by controlling a number of I/O connections to the substrate and an I/O signal frequency of the substrate.
6 . The computing device of claim 1 , wherein the memory stack is disposed on the processor to be directly connected to the processor without a buffer.
7 . The computing device of claim 6 , wherein
the processor is disposed in a direction in which a circuit board of the processor faces the substrate,
the processor and the memory stack are connected through a TSV, and
the processor and the substrate are connected through a bump.
8 . The computing device of claim 6 , wherein
the processor is disposed in a direction in which a circuit board of the processor faces the memory stack,
the processor and the memory stack are connected as a TSV connected to the memory stack and an upper end pad of the processor are connected through a micro-bump, and
the processor and the substrate are connected through a bump.
9 . The computing device of claim 1 , further comprising:
a buffer configured to connect the memory stack and the processor; and
an interposer disposed between the processor and the substrate,
wherein the memory stack is disposed on the buffer, and is connected to the processor through the buffer and the interposer.
10 . The computing device of claim 1 , wherein
a number of channels used in the computing device is determined based on a total number of available lanes and a number of allocated lanes per channel of the computing device,
the total number of available lanes is determined by either one or both an area of the processor and an area of the substrate, and
the number of allocated lanes per channel is determined according to a network protocol of the computing device.
11 . An electronic device comprising:
a plurality of computing devices and switches grouped into a plurality of groups, the computing devices comprising the computing device of claim 1 ,
wherein each of switches comprised in a first group among the groups is exclusively connected to any one of switches comprised in a second group among the groups, and a connection between a computing device and a switch in the same group and a connection between switches in different groups are an electrical connection.
12 . An electronic device comprising:
a plurality of computing devices and switches grouped into a plurality of groups,
wherein switches in a same group among the groups are fully connected to computing devices in the same group,
wherein each of switches comprised in a first group among the groups is, among switches comprised in a second group among the groups, exclusively connected to any one of the switches comprised in the second group,
wherein a connection between a computing device and a switch in the same group and a connection between switches in different groups are an electrical connection,
wherein one or more of the computing devices comprises:
a processor;
a memory stack in which memories connected to the processor are stacked; and
a substrate disposed under the processor, and
wherein a memory bandwidth between the processor and the memory stack is five or less times a network bandwidth between the processor and the substrate.
13 . The electronic device of claim 12 , wherein
a computational performance of the processor is determined based on an area of the processor, and
the network bandwidth per the computational performance of the processor is greater than or equal to 0.1 bytes per flop.
14 . The electronic device of claim 12 , wherein an area of the substrate is five or greater times an area of the processor.
15 . The electronic device of claim 12 , wherein
the memory bandwidth is determined based on a through-silicon via (TSV) area present between the processor and the memory stack, and
the network bandwidth is determined based on an input/output (I/O) area of the processor and an area of the substrate.
16 . The electronic device of claim 12 , wherein the processor is configured to:
determine the memory bandwidth by controlling a number of TSV connections to the memory stack and a memory signal frequency of the memory stack; and
determine the network bandwidth by controlling a number of I/O connections to the substrate and an I/O signal frequency of the substrate.
17 . The electronic device of claim 12 , wherein the memory stack is disposed on the processor to be directly connected to the processor without a buffer.
18 . The electronic device of claim 17 , wherein
the processor is disposed in a direction in which a circuit board of the processor faces the substrate,
the processor and the memory stack are connected through a TSV, and
the processor and the substrate are connected through a bump.
19 . An electronic device comprising:
a computing board comprising:
a plurality of computing devices, wherein each of the computing devices comprises a processor, a memory stack in which memories connected to the processor are stacked, and a substrate disposed under the processor, the processor and the memory stack are connected through a through-silicon via (TSV), and a memory bandwidth established through the TSV between the processor and the memory stack is five or less times a network bandwidth between the processor and the substrate; and
a switch group comprising a plurality of switches, wherein each of the switches is connected to each of the computing devices.
20 . The electronic device of claim 19 , further comprising:
a plurality of other computing boards, each comprising another switch group,
wherein each of the switches is exclusively connected to a single switch in each of other switch groups.