Granted Patent
Utility
US 6,642,736 · App. 09/904,625
Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits
Inventors:
Hisaya Mori, Shinji Yamada, Teruhiko Funakura
Patented Case
View Patent ↗
Granted: Nov 4, 2003
Filed: Jul 16, 2001
Inventors
Hisaya Mori
Shinji Yamada
Teruhiko Funakura
Assignees (at issue)
MITSUBISHI ELECTRIC CORPORATION
Ryoden Semiconductor System Engineering Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.