Granted Patent
Utility
US 6,661,248 · App. 10/145,192
Tester for semiconductor integrated circuits
Inventors:
Hisaya Mori, Shinji Yamada, Teruhiko Funakura, Hisayoshi Hanai
Patented Case
View Patent ↗
Granted: Dec 9, 2003
Filed: May 15, 2002
Inventors
Hisaya Mori
Shinji Yamada
Teruhiko Funakura
Hisayoshi Hanai
Assignees (at issue)
MITSUBISHI ELECTRIC CORPORATION
Ryoden Semiconductor System Engineering Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.