Sense amplifier circuit for content addressable memory device
View Patent ↗A sense amplifier for a content addressable memory (CAM) device can utilize charge sharing between a match line and a pseudo-supply line to indicate a mis-match indication. A sense amplifier ( 200 ) can include match line ( 202 ) that can be precharged to a high supply potential (VCC), a sense node ( 206 ), and a pseudo-VSS (PVSS) line ( 204 ) that can be precharged to a low supply potential (VSS). In a match result, match line ( 202 ) can remain precharged, keeping sense device (P 2 ) turned off, and sense node ( 206 ) remains low, generating a low output signal (SAOUT). In a mis-match result, match line ( 202 ) and sense node ( 206 ) can be equalized. A resulting drop in match line ( 202 ) potential can turn on sense device (P 2 ), and sense node ( 206 ) can be pulled high. As a result, output signal (SAOUT) can be driven high.
1. A sense amplifier circuit, comprising:
a first pre-charge device having a controllable impedance path coupled between a sense node and a first predetermined potential;
a sense transistor having a gate coupled to a first electrically isolatable line, a drain coupled to the sense node, and a source coupled to a second predetermined potential; and
a plurality of compare circuits coupled between the first electrically isolatable line and a second electrically isolatable line, each compare circuit enabling a low impedance path between the first electrically isolatable line and the second electrically isolatable line according to a comparison between at least two data bit values.
2. The sense amplifier circuit of claim 1 , wherein:
the first precharge device comprises a transistor of a first conductivity type and the sense transistor is of a second conductivity type.
3. The sense amplifier circuit of claim 1 , wherein:
the first electrically isolatable line is a match line that is precharged toward a first power supply voltage before being electrically isolated; and
the second electrically isolatable line is a pseudo-power supply line that is precharged toward a second power supply voltage before being electrically isolated.
4. The sense amplifier circuit of claim 1 , further including:
a second pre-charge device having a controllable impedance path coupled between the second electrically isolatable line and the first predetermined potential.
5. The sense amplifier circuit of claim 1 , further including:
a third precharge device having a controllable impedance path coupled between the first electrically isolatable line and the second predetermined potential.
6. The sense amplifier circuit of claim 1 , further including:
a latching device that enables a low impedance path between the first electrically isolatable line and the second predetermined potential in response to the sense node potential.
7. The sense amplifier circuit of claim 1 , further including:
each compare circuit includes a first current path arranged in parallel with a second current path, each current path including at least two insulated gate field effect transistors having source-drain paths arranged in series.
8. A sense amplifier circuit, comprising:
a first electrically isolatable line;
a second electrically isolatable line; and
a sense device that provides a low impedance path between a first voltage and a sense node in response to the voltage between the first and second electrically isolatable lines being driven toward an equalized potential, the sense node providing a comparison result signal.
9. The sense amplifier circuit of claim 8 , further including:
a node precharge device that provides a low impedance path between a second voltage and the sense node in response to a precharge signal.
10. The sense amplifier circuit of claim 8 , further including:
a first line precharge device that provides a low impedance path between the first voltage and the first electrically isolatable line when a precharge signal is active, and provides a high impedance path between the first voltage and the first electrically isolatable line when the precharge signal is inactive.
11. The sense amplifier circuit of claim 8 , further including:
a second line precharge device that provides a low impedance path between the second voltage and the second electrically isolatable line when a precharge signal is active, and provides a high impedance path between the second voltage and the second electrically isolatable line when the precharge signal is inactive.
12. The sense amplifier circuit of claim 8 , further including:
a feedback path between the sense node and a latching device that provides a feedback signal that follows the sense node voltage; and
the latching device provides a low impedance path between the first electrically isolatable line and the first voltage in response to the feedback signal.
13. The sense amplifier circuit of claim 8 , further including:
a plurality of content addressable memory (CAM) cells coupled between the first and second electrically isolatable lines, each CAM cell providing a comparison result between a compare data bit and a stored data bit.
14. The sense amplifier circuit of claim 13 , wherein:
each CAM cell performs less than 0.7 femtoJoules per bit of work per search cycle, in the event of a mismatch between the compare data bit and stored data bit.
15. A method for sensing compare results in a content addressable memory (CAM) device, comprising the steps of:
in a pre-sense period, precharging a first line to a first voltage, precharging a second line to a second voltage, and electrically isolating the first and second lines; and
in a sense period, generating a mis-match indication when the first and second lines are equalized, generating a match indication when the first line remains at essentially the first voltage.
16. The method of claim 15 , wherein:
precharging the first line to the first voltage includes precharging the first line toward a high power supply potential, and
precharging the second line to the second voltage includes precharging the second line toward a low power supply potential.
17. The method of claim 15 , further including:
the compare operation includes comparing a multi-bit compare data value to a multi-bit stored value; and
providing a low impedance path between the first line and second line for each mis-match between a compare data bit and a corresponding stored data bit.
18. The method of claim 15 , further including:
in the pre-sense period, precharging a sense node to the second voltage; and
in the sense period, generating the mis-match indication includes changing the sense node from the second voltage to the first voltage.
19. The method of claim 18 , wherein;
equalizing the first and second lines generates an equalization voltage on the first and second lines, and the difference in potential between the equalization voltage and the first potential exceeds a threshold voltage of sense transistor; and
changing the sense node from the second voltage to the first voltage includes activating the sense transistor.
20. The method of claim 15 , wherein:
generating the mis-match indication includes doing no more than 0.7 femtoJoules of work per bit per compare cycle.