Laser decapsulation method
View Patent ↗A decapsulation apparatus 100 has a laser 8 that removes plastic encapsulant from a device 24 . Chamber 20 is sealed. Exhaust port 9 removes debris and fumes. The device 24 is positioned and scanned using an X, Y table 2 . A hinged end 4 rotates the device to an acute angle of incidence with respect to a laser 8. Endpoint detector 10 senses the exposed integrated circuit and moves or shuts down the laser 8.
1. A method of manufacturing integrated circuits, the method comprising;
forming encapsulated integrated circuits; and
sampling select integrated circuits to verify if the finished integrated circuits are made to manufacturing specifications by selectively removing portions of the encapsulation with a laser that is suitable for breaking cross linked bonds of the encapsulant without damaging the integrated circuits, wherein a thin layer of encapsulant is left on at least one portion of at least one of the sampled integrated circuits.
2. The method of claim 1 , wherein selectively removing portions of the encapsulant of the select sampled integrated circuits further comprises:
monitoring amplitude and frequency of the laser light reflected of each selected integrated circuit; and
when a change in at least one of the amplitude and frequency is detected, moving each selected integrated circuit.
3. The method of claim 2 , wherein moving each selected integrated circuit further comprises:
advancing a stage upon which the select integrated circuit is mounted on.
4. The method of claim 1 , wherein selectively removing portions of the encapsulant of the select sampled integrated circuits with a laser further comprises:
using a laser with wavelengths in the infrared range that includes at least one range of 725-900 cm-1, 1150-1300 cm-1, 1400-1500 cm-1 and 1600-1750 cm-1.
5. The method of claim 1 , wherein selectively removing portions of the encapsulation of the select sampled integrated circuits with a laser further comprises:
using at least one of a YAG laser and an infrared laser.
6. The method of claim 1 , wherein selectively removing portions of the encapsulation of the select sampled integrated circuits further comprises:
changing an angle of incident of the laser by rotating a stage upon which the integrated circuits are mounted.
7. The method of claim 1 , further comprising:
testing the thin layer of encapsulant for contaminates.
8. The method of claim 1 , wherein selectively removing portions of the encapsulation of the select sampled integrated circuits further comprises:
removing debris caused by the removal of select portions of encapsulate by at least one of using a flow of gas to direct the debris away from the integrated circuits and capturing the debris in a dust bin.
9. A method of manufacturing integrated circuits, the method comprising:
forming integrated circuits with a manufacturing process, wherein each integrated circuit is encapsulated to protect the integrated circuit from environmental factors;
selecting certain formed integrated circuits;
placing each selected integrated circuit on a stage in an enclosure;
directing a laser beam having a select wavelength on a select portion of the encapsulant to remove the select portion of encapsulant, wherein with at least one of the select integrated circuits the select removed portion of encapsulant has a depth, the depth being less than a thickness of the encapsulant;
monitoring the laser beam reflected off of the integrated circuit;
moving the stage based at least in part on the monitored reflected laser beam;
terminating the laser beam based at least in part on the monitored reflect laser beam; and
testing the selected integrated circuits with the select portion of encapsulant removed to verify that the integrated circuits are formed to manufacture specifications.
10. The method of claim 9 , further comprising:
exhausting debris from the enclosure.
11. The method of claim 10 , wherein exhausting debris from the stage further comprises:
directing a flow of gas to disperse the debris away from the integrated circuit.
12. The method of claim 9 , further comprising:
catching debris particles in a dust bin.
13. The method of claim 9 , further comprising:
testing for contaminates in a thin layer of encapsulant left on the at least one select integrated circuit having the select removed portion with a depth less than the depth of the encapsulant.
14. A manufacturing method of removing encapsulant from an integrated circuit; the method comprising:
placing an integrated circuit on a stage in an enclosure;
directing a laser beam on the encapsulation of the integrated circuit, wherein the laser beam has a wavelength that is suitable for breaking cross linked bonds of the encapsulant without damaging the underlying integrated circuit;
removing at least one select portion of the encapsulant with the laser beam; and
capturing debris particles in a dust bin.
15. The method of claim 14 , further comprising:
monitoring the laser beam reflected off of the integrated circuit; and
based at least in part on the monitored laser beam, doing at least one of moving the stage and terminating the laser beam.
16. The method of claim 14 , further comprising:
after the removing the at least one select portion of the encapsulant, verifying the integrated circuit is made to manufacturing specifications.
17. The method of claim 14 , further comprising:
directing a flow of gas to move the debris away from the integrated circuit.
18. The method of claim 14 , further comprising:
leaving a thin layer of encapsulant at the at least one select portion, and
testing for contaminates in the thin layer of encapsulant.