Method of manufacturing semiconductor device having chip stacks combined in relation to the number of chips having defects
View Patent ↗After stacking m wafers in each of which a plurality of semiconductor chips are formed, the m wafers are diced to semiconductor chips to form a first chip stack having m of the semiconductor chips stacked, and, after stacking n wafers, the n wafers are diced to semiconductor chips to form a second chip stack having n of the semiconductor chips stacked. Next, the first chip stack is sorted according to the number of defective semiconductor chips included in the first chip stack, and the second chip stack is sorted according to the number of defective semiconductor chips included in the second chip stack. Furthermore, the first chip stack or the second chip stack after sorting are combined to form a third chip stack.
1. A method of manufacturing a semiconductor device, comprising:
after stacking m wafers (where m is a number of two or more) in each of which a plurality of semiconductor chips are formed, dicing the m wafers to semiconductor chips to form first chip stacks each having m of the semiconductor chips stacked;
after stacking n of the wafers (where n is a number of two or more), performing dicing of the n wafers on the basis of the semiconductor chips to form second chip stacks each having n of the semiconductor chips stacked;
sorting the first chip stacks according to the number of defective semiconductor chips included in each of the first chip stacks;
sorting the second chip stacks according to the number of defective semiconductor chips included in each of the second chip stacks; and
combining the first chip stacks and/or the second chip stacks after sorting to form a third chip stack according to the number of total number of defective semiconductor chips included in first chip stacks or second chip stacks that are to be combined,
wherein the third chip stack is combined by selecting semiconductor chips from the first chip stacks and/or the second chip stacks such that a number of non-defective semiconductor chips included in the third chip stack is p, p being an integer that meets m<p and n<p.
2. The method of manufacturing a semiconductor device according to claim 1 , wherein
n is a number larger than m by an amount of 1 (n=m+1).
3. The method of manufacturing a semiconductor device according to claim 1 , further comprising:
before the dicing, forming a penetrating electrode that penetrates the wafers.
4. The method of manufacturing a semiconductor device according to claim 1 , wherein
either one of the first chip stack and the second chip stack includes one defective semiconductor chip, and the semiconductor chips included in the other of the first chip stack and the second chip stack are all non-defective semiconductor chips.
5. The method of manufacturing a semiconductor device according to claim 4 , wherein n is a number larger than m by an amount of 1 (n=m+1).
6. The method of manufacturing a semiconductor device according to claim 1 , wherein the m wafers are joined to one another before the dicing.
7. The method of manufacturing a semiconductor device according to claim 6 , wherein the first chip stack and the second chip stack are formed without disconnecting m of the wafers or n of the wafers.
8. The method of manufacturing a semiconductor device according to claim 1 , wherein the first chip stack or the second chip stack may include a defective semiconductor chip.