System and method for electrical data link testing
View Patent ↗A system and method provides for direct control of a high speed data link in a computer system for purposes of testing the data link under a full range of anticipated operating conditions. The transmission of test data is preferably under hardware control and preferably does not encounter interference from other data sources in the computer system thereby enabling the intended test pattern data to be experienced by the data link under test in unaltered form. The tested data is preferably compared to the original data in order to evaluate the status of the link under test.
1. A method for testing a high speed data link, the method comprising the steps of:
preparing a sequence of test patterns;
transmitting substantially only said prepared sequence of test patterns over said high speed data link; and
evaluating an integrity of said high speed data link based on said transmitted prepared sequence of test patterns.
2. The method of claim 1 wherein said transmitting step comprises:
transmitting only said prepared sequence of test patterns.
3. The method of claim 1 wherein said transmitting step comprises:
employing hardware to conduct said transmitting step, thereby effecting rapid communication of said prepared sequence of test patterns over said high speed data link.
4. The method of claim 1 wherein said preparing step comprises:
scanning said test patterns into a shift register.
5. The method of claim 1 wherein said preparing step comprises:
storing said test patterns in an integrated chip coupled to said high speed data link.
6. The method of claim 1 wherein said preparing step comprises:
hard wiring said test patterns into an integrated chip coupled to said high speed data link.
7. The method of claim 1 further comprising the step of:
placing said high speed data link in a test mode prior to said transmitting step.
8. The method of claim 1 further comprising the step of:
receiving said transmitted test patterns at a receiving end of said high speed data link.
9. The method of claim 1 wherein the evaluating step of comprises the step of:
comparing said transmitted prepared data patterns with said prepared data patterns.
10. The method of claim 1 further comprising the steps of:
employing said high speed data link for normal communication of an integrated chip conducting said transmitting step; and
switching said chip into a diagnostic mode prior to said transmitting step.
11. Apparatus for testing a data link, the apparatus comprising:
test pattern data available for transmission over said data link;
a driver for causing said test pattern data to be transmitted over said data link; and
a switch coupled to said driver for disabling transmission of data other than said test pattern data over said data link, thereby enabling transmission of undisturbed test pattern data over said link.
12. The apparatus of claim 11 further comprising:
a shift register for storing said test pattern data.
13. The apparatus of claim 12 further comprising:
a scan controller for loading test pattern data into said shift register.
14. The apparatus of claim 11 wherein said switch is a multiplexer.
15. The apparatus of claim 11 further comprising:
a synchronizer for receiving said test pattern data into a chip at a receiving end of said data link.
16. The apparatus of claim 15 further comprising:
a receiving FIFO for storing said received test pattern data in said receiving chip.
17. A system for testing a communication link, the system comprising:
means for preparing test pattern data for transmission over said communication link;
means for transmitting said prepared test pattern data over said communication link; and
means for excluding data other than said test pattern data from transmission over said link during said testing of said communication link.
18. The system of claim 17 further comprising:
clock means for synchronizing said means for transmitting said prepared test pattern data.
19. The system of claim 17 wherein said preparing means comprises:
means for permanently storing said test pattern data in a chip at a transmitting end of said communication link.
20. The system of claim 17 further comprising:
means for receiving said transmitted test pattern data; and
means for evaluating said communication link based on said received transmitted test pattern data and said prepared test pattern data.