IP Library Granted Patent US 6,844,663
Granted Patent B1
US 6,844,663 · App. 09/588,115 · Granted Jan 18, 2005

Structure and method for forming a multilayer electrode for a flat panel display device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 6,844,663
App. No.
09/588,115
Granted
Jan 18, 2005
Kind
B1
Abstract

A structure for a multilayer electrode. Specifically, in one embodiment, a multilayer electrode for a flat panel display device is disclosed. The multilayer electrode comprises a metal alloy layer and a protective layer. The metal alloy layer includes neodymium having a concentration of between greater than three atomic percent and six atomic percent. The protective layer is disposed above the metal alloy layer to form a multilayer stack. The multilayer stack is etched to form the multilayer electrode.

Claims (18)

1. A multilayer electrode for a flat panel display device, said multilayer electrode comprising:

a metal alloy layer, wherein said metal alloy layer includes neodymium having a concentration of between greater than three atomic percent and six atomic percent; and

a protective layer disposed above said metal alloy layer to form a multilayer stack, said multilayer stack etched to form said multilayer electrode, wherein said protective layer includes an molybdenum tungsten alloy.

2. The multilayer electrode for a flat panel display device as recited in claim 1 , wherein said metal alloy layer is comprised of aluminum and neodymium.

3. The multilayer electrode for a flat panel display device as recited in claim 1 , wherein said metal alloy layer has a depth of approximately 2500 angstroms.

4. The multilayer electrode for a flat panel display device as recited in claim 1 , wherein said molybdenum tungsten alloy in said protective layer includes a tungsten concentration of 5 to 30 atomic percent.

5. The multilayer electrode for a flat panel display device as recited in claim 1 , wherein said protective layer has a depth of approximately 1200 angstroms.

6. A multilayer electrode for a flat panel display device, said multilayer electrode comprising:

a metal alloy layer, wherein said metal alloy layer includes neodymium having a concentration of between greater than three atomic percent and six atomic percent;

a barrier layer disposed above said metal alloy layer; and

a protective layer disposed above said metal alloy layer to form a multilayer stack, said multilayer stack etched to form said multilayer electrode, wherein said protective layer includes an molybdenum tungsten alloy.

7. The multilayer electrode for a flat panel display device as recited in claim 6 , wherein said metal alloy layer is comprised of aluminum and neodymium.

8. The multilayer electrode for a flat panel display device as recited in claim 6 , wherein said metal alloy layer has a depth of approximately 2500 angstroms.

9. The multilayer electrode for a flat panel display device as recited in claim 6 , wherein said barrier layer is comprised of a native oxide layer of said metal alloy layer.

10. The multilayer electrode for a flat panel display device as recited in claim 6 , wherein said barrier layer has a depth of less than approximately 100 angstroms.

11. The multilayer electrode for a flat panel display device as recited in claim 6 , wherein said molybdenum tungsten alloy in said protective layer includes a tungsten concentration of 5 to 30 atomic percent.

12. The multilayer electrode for a flat panel display device as recited in claim 6 , wherein said protective layer has a depth of approximately 1200 angstroms.

13. The multilayer electrode for a flat panel display device as recited in claim 6 , wherein said multilayer electrode is etched using a wet etchant with volume percentages of constituents of approximately 70-80 percent H 3 PO 4 ; approximately 10-15 percent HNO 3 ; approximately 7-12 percent CH 3 COOH; and approximately 2-8 percent H 2 O to form a desired sloped profile.

Assignments (3)
NUNC PRO TUNC ASSIGNMENT Recorded Jun 24, 2007
From: CANDESCENT TECHNOLOGIES CORPORATION
To: CANON KABUSHIKI KAISHA
Reel/Frame 019466/0345 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2007
From: CANDESCENT INTELLECTUAL PROPERTY SERVICES, INC.
To: CANON KABUSHIKI KAISHA
Reel/Frame 019035/0114 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEES. THE NAME OF AN ASSIGNEE WAS INADVERTENTLY OMITTED FROM THE RECORDATION FORM COVER SHEET PREVIOUSLY RECORDED ON REEL 011848 FRAME 0040. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT OF ASSIGNOR'S INTEREST. Recorded Nov 1, 2006
From: CANDESCENT TECHNOLOGIES CORPORATION
To: CANDESCENT TECHNOLOGIES CORPORATION; CANDESCENT INTELLECTUAL PROPERTY SERVICES, INC.
Reel/Frame 018463/0330 →