P-type nitride semiconductor and method of manufacturing the same
View Patent ↗A method for manufacturing p-type nitride semiconductor comprising a semiconductor layer forming process where a low resistivity p-type nitride semiconductor layer is formed on a substrate by introducing the sources of p-type dopant, nitrogen and Group III sources on a substrate held at a temperature of 600° C. or higher and a cooling process for cooling the substrate which is bearing the p-type nitride semiconductor layer. The manufacturing method features in that the hole carrier concentration of the p-type nitride semiconductor layer decreases during the cooling process. A superior quality p-type nitride semiconductor is made available, without needing any annealing treatment after growth, by properly specifying the concentration of atmosphere gas and the cooling time.
1. A method for manufacturing a semiconductor, comprising:
a growing process for growing a p-type nitride semiconductor layer over a substrate in an atmosphere containing at least a p-type dopant and hydrogen; and
a cooling process for cooling the substrate in an atmosphere containing at least hydrogen greater than 0% and less than or equal to 50% in capacity percent, said cooling process being performed with a combination of hydrogen concentration in the atmosphere and cooling time such that the resulting p-type nitride semiconductor layer has a hole carrier concentration of approximately 1×10 16 cm −3 or higher at room temperature.
2. The method according to claim 1 , wherein the temperature of the substrate is reduced to approximately 600° C. within 25 minutes.
3. The method according to claim 1 , wherein the temperature of the substrate is reduced to approximately 600° C. within 20 minutes.
4. The method according to claim 1 , wherein the temperature of the substrate is reduced to approximately 600° C. within 15 minutes.
5. The method according to claim 1 , wherein the temperature of the substrate is reduced to approximately 600° C. within 10 minutes.
6. The method according to claim 1 , wherein the temperature of the substrate is reduced to approximately 600° C. within 5 minutes.
7. The method according to claim 1 , wherein the hole carrier concentration of said p-type nitride semiconductor layer decreases during said cooling process.
8. The method according to claim 7 , wherein the decrease of said hole carrier concentration is greater than 0% and less than or equal to 95%.
9. The method according to claim 1 , wherein the atmosphere in said growing process contains hydrogen for 5%–70% in capacity percent.
10. The method according to claim 1 , wherein during said cooling process, the substrate is in an atmosphere containing ammonia.
11. A method for manufacturing a semiconductor, comprising:
a growing process for growing a p-type nitride semiconductor layer over a substrate in an atmosphere containing at least a p-type dopant and hydrogen; and
a cooling process for cooling the substrate from approximately 950° C. to approximately 700° C. in an atmosphere containing at least hydrogen, said cooling process being performed with a combination of hydrogen concentration in the atmosphere and cooling time such that the resulting p-type nitride semiconductor layer has a hole carrier concentration of approximately 1×10 16 cm −3 or higher at room temperature.
12. The method according to claim 11 , wherein the combination of said hydrogen concentration in atmosphere and said cooling time falls within a region specified by points A-B-C-D-E-F, in an X-Y coordinate, X axis representing said hydrogen concentration (%) in atmosphere, Y axis representing said cooling time (min.); where, the point A(50, 1.0), point B(30, 1.8), point C(10, 4.1), point D(0, 15), point E(0, 0.5) and point F(50, 0.5).
13. A method for manufacturing a semiconductor, comprising:
a growing process for growing a p-type nitride semiconductor layer over a substrate in an atmosphere containing at least a p-type dopant and hydrogen; and
a cooling process for cooling the substrate in an atmosphere containing at least hydrogen, said cooling process being performed at the vicinity of approximately 800° C. with a combination of hydrogen concentration in the atmosphere and cooling rate such that the resulting p-type nitride semiconductor layer has a hole carrier concentration of approximately 1×10 16 cm −3 or higher at room temperature.
14. The method according to claim 13 , wherein the combination of said hydrogen concentration in atmosphere and said cooling rate falls within a region specified by points O-P-Q-R-S-T, in an X-Y coordinate, X axis representing said hydrogen concentration (%) in atmosphere, Y axis representing said cooling rate (° C. min.); where, the point O(50, 250), point P(30, 140), point Q(10, 61), point R(0, 17), point S(0, 500) and point T(50, 500).
15. The method according to claim 1 , wherein the temperature of the substrate is reduced to approximately 600° C. within 30 minutes.
16. The method for manufacturing a semiconductor 1 , wherein the cooling time for cooling the substrate from 950° C. to approximately 600° C. is controlled.