Signal inspection device
View Patent ↗An inspection process and method that is performed not by the operation of a PC but within the inspection device itself according to the inspection program stored in a memory circuit in the inspection device. Therefore, the inspection is performed without being affected by the performance of a PC with constant stability and reliability.
1. A signal inspection device for testing any of a plurality of electronic devices that receive inputs and output outputs signals in response thereto, said signal inspection device comprising a memory circuit comprised of an EEPROM for storing an inspection program adapted to electronic devices to be inspected, said memory circuit being capable of being programmed by a personal computer external to said signal inspection device and detachably connectable thereto for programming said memory circuit to suit the electronic device to be tested, a power supply for applying input signals to an electronic device detachably connected to said signal inspection device from said signal inspection device, and a display for receiving and displaying output signals from the electronic device being tested in response to the applied input signals and created as an interactive type of displayed image on said external personal computer and transferred therefrom to said memory circuit.
2. A signal inspection device as set forth in claim 1 , wherein the display is driven solely by the signal inspection device and operates independently of any personal computer.