IP Library Granted Patent US 7,103,276
Granted Patent B1
US 7,103,276 · App. 09/745,157 · Granted Sep 5, 2006

Optical band scanning monitor system and method

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Quick Facts
Patent No.
US 7,103,276
App. No.
09/745,157
Granted
Sep 5, 2006
Kind
B1
Abstract

A scanning optical monitoring system and method are appropriate for high speed scanning of a WDM signal band. The system and method are able to identify dropped channels or, more generally, discrepancies between the determined or detected channel inventory and a perpetual inventory for the WDM signal, which perpetual inventory specifies the channels that should be present in the WDM signal assuming proper operation of the network. The system includes a tunable optical filter that scans a pass band across a signal band of a WDM signal to generate a filtered signal. A photodetector then generates an electrical signal in response to this filtered signal. A decision circuit compares the electrical signal to a threshold and a controller, which is responsive to the decision circuit, inventories the channels in the WDM signal.

Claims (54)

1. A scanning optical monitoring system, comprising:

a tunable optical filter that scans a pass band across a signal band of an input signal to generate a filtered signal corresponding to a spectrum of the input signal;

a photo detector that generates an electrical signal in response to the filtered signal;

a decision circuit that compares the electrical signal to a threshold; and

a controller that is responsive to the decision circuit to identify spectral features in the input signal by comparing a spectral position of an instantaneous pass band of the tunable filter to a response of the decision circuit to determine the spectral features of the input signal, the instantaneous pass band of the filter being determined by reference to a delay from a generation of a trigger signal starting the scan.

2. A scanning optical monitor system as claimed in claim 1 , wherein the tunable optical filter tunes across the signal band in less than 1 millisecond.

3. A scanning optical monitor system as claimed in claim 1 , wherein the tunable optical filter begins and ends a complete scan in less than 1 millisecond.

4. A scanning optical monitor system as claimed in claim 1 , wherein the tunable optical filter tunes across one half of the signal band in less than 1 millisecond.

5. A scanning optical monitor system as claimed in claim 1 , wherein the tunable optical filter is a Fabry-Perot filter.

6. A scanning optical monitor system as claimed in claim 1 , further comprising an electronic filter that low pass filters the electronic signal from the photo detector prior to reception by the decision circuit.

7. A scanning optical monitor system as claimed in claim 1 , wherein the controller compares the spectral features to expected signal information to assess a validity of the input signal.

8. A scanning optical monitor system as claimed in claim 1 , wherein the tunable filter comprises an electrostatic drive cavity in which an electrostatic field is generated to displace a flexible membrane of the tunable filter.

9. A scanning optical monitor system as claimed in claim 1 , wherein a free spectral range of the tunable filter is greater than a bandwidth of the signal band of the input signal.

10. A scanning optical monitor system as claimed in claim 1 , wherein a free spectral range of the tunable filter is less than a bandwidth of the signal band.

11. A scanning optical monitor system as claimed in claim 1 , wherein a free spectral range of the tunable filter is less than a bandwidth of the signal band but greater than one-half of the bandwidth of the signal band.

12. A scanning optical monitor system as claimed in claim 11 , further comprising:

an input filter for separating the filtered signal into a first sub-band and a second sub-band; and

a first sub-band detector and a second sub-band detector.

13. A scanning optical monitor system as claimed in claim 1 , further comprising a timing recovery circuit that controls sampling of the decision circuit by the controller.

14. A scanning optical monitor system as claimed in claim 1 , wherein the controller generates a threshold set signal the specifies a level of the threshold applied by the decision circuit.

15. A scanning optical monitor system as claimed in claim 1 , further comprising a filter tuning voltage generator that generates a tuning voltage to the optical tunable filter.

16. A scanning optical monitor system as claimed in claim 1 , further comprising a filter tuning voltage generator that generates a tuning voltage to the optical tunable filter that improves a linearization of the tuning of the passband as a function of time over at least a portion of the scan of the signal band.

17. A scanning optical monitor system as claimed in claim 1 , further comprising a filter tuning voltage generator that generates a tuning voltage to the optical tunable filter that linearizes the tuning of the passband as a function of time over at least a portion of the scan of the signal band.

18. A scanning optical monitor system as claimed in claim 17 , wherein the filter tuning voltage generator maps an inverse of a tuning function of the optical tunable filter.

19. A scanning optical monitor system as claimed in claim 17 , wherein the filter tuning voltage generator comprises a look-up table.

20. A scanning optical monitor system as claimed in claim 1 , wherein the input signal is a wavelength division multiplexed signal and the spectral features are an inventory of WDM channels.

21. A scanning optical monitoring system, comprising:

a tunable optical filter that scans a pass band across a signal band of an input signal to generate a filtered signal corresponding to a spectrum of the input signal;

a photo detector that generates an electrical signal in response to the filtered signal;

a variable decision circuit that compares the electrical signal to a variable threshold; and

a controller that sets a level of the variable threshold and is responsive to the decision circuit to analyze power in the input signal based on the level of the variable threshold by comparing a spectral position of an instantaneous pass band of the tunable filter to a response of the decision circuit to determine spectral features of the input signal, the instantaneous pass band of the filter being determined by reference to a delay from a generation of a trigger signal starting the scan.

22. A method for analyzing an input signal comprising:

tuning a pass band of a filter across a signal band of the input signal to generate a filtered signal corresponding to the spectrum of the input signal;

detecting the filtered signal;

comparing a level of the detection signal to a threshold;

comparing an instantaneous pass band spectral position of the filter to a level of the detection signal relative to the threshold to analyze spectral features in the input signal; and

determining the instantaneous pass band of the filter by reference to a delay from a generation of a trigger signal starting the scan.

23. A method as claimed in claim 22 , further comprising tuning the filter across the signal band in less than 1 millisecond.

24. A method as claimed in claim 22 , further comprising tuning the filter across one half of the signal band in less than 1 millisecond.

25. A method as claimed in claim 22 , further comprising low pass filtering a detection signal prior to the step of comparing the detection signal to the threshold.

26. A method as claimed in claim 22 , further comprising comparing the spectral feature to perpetual inventory information.

27. A method as claimed in claim 22 , further comprising tuning multiple modes of the filter across the signal band simultaneously.

28. A method as claimed in claim 22 , further comprising changing the threshold between scans to determined channel powers in the input signal.

29. A method as claimed in claim 22 , further comprising driving the filter with a tuning function that is non-linear with response to time across the scan and improving a linearization of the tuning of the passband as a function of time over at least a portion of the scan of the signal band.

30. A method for analyzing a WDM signal comprising:

tuning a pass band of a filter across a signal band of the WDM signal to generate a filtered signal in a first scan of the WDM signal;

detecting the filtered signal;

comparing a level of a detection signal to a first threshold;

comparing an instantaneous pass band of the filter to a level of the detection signal relative to the first threshold;

tuning the passband of the filter across the signal band in a second scan of the WDM signal;

comparing the level of the detection signal to a second threshold;

comparing an instantaneous pass band of the filter to a level of the detection signal relative to the second threshold;

comparing the first scan and the second scan to determined channel power; and

determining the instantaneous pass band of the filter by reference to a delay from a generation of a trigger signal starting the scan.

Assignments (2)
CHANGE OF NAME Recorded Aug 31, 2017
From: AXSUN TECHNOLOGIES, LLC
To: AXSUN TECHNOLOGIES, INC.
Reel/Frame 043733/0195 →
CHANGE OF NAME Recorded Feb 24, 2016
From: AXSUN TECHNOLOGIES, INC.
To: AXSUN TECHNOLOGIES LLC
Reel/Frame 037901/0152 →