Method and apparatus to pre-scan and pre-treat film for improved digital film processing handling

1. A defect detection system, for use in an image processing system wherein the suitability of a film for processing is determined prior to scanning, the defect detection system comprising:

a sensor for detecting one or more imperfections on the film; and

a microprocessor connected to the sensor that determines an amount and extent of imperfections on the film based on one or more reference sensor readings, and enables a determination of whether remedial actions can be taken to make film having detected imperfections thereon suitable for processing.

2. The defect detection system as recited in claim 1 , wherein the image processing system comprises a digital film processing system.

3. The defect detection system as recited in claim 1 , further comprising an output device to report the amount and extent of imperfections on the film.

4. The defect detection system as recited in claim 1 , further comprising a reference sensor and a memory, wherein the reference sensor readings are determined by the reference sensor and stored in the memory.

5. The defect detection system as recited in claim 1 , wherein the sensor is a reflective sensor.

6. The defect detection system as recited in claim 1 , wherein the sensor detects light transmitted through the film.

7. The defect detection system as recited in claim 1 , further comprising a tape dispenser positioned to repair the film if the imperfection detected by the sensor is a breakage in the film.

8. The defect detection system as recited in claim 1 , wherein the sensor detects the abnormalities in the shape of the perforations on the film.

9. The defect detection system as recited in claim 1 , wherein the sensor detects moisture on the film.

10. The defect detection system as recited in claim 1 , wherein the sensor detects oil on the film.

11. The defect detection system as recited in claim 1 , wherein the

sensor detects the moisture level of the film and if the moisture level is above a predetermined acceptable moisture level the film is dried until the moisture level drops below the predetermined acceptable moisture level.

12. The defect detection system as recited in claim 1 , wherein the sensor detects foreign objects on the film.

13. The defect detection system as recited in claim 1 , wherein the sensor detects foreign objects on the film and if the amount of foreign objects on the film is above a predetermined acceptable foreign object level the film is cleaned until the foreign object level drops below the predetermined acceptable foreign object level.

14. A defect detection system for use in image processing system, the defect detection system comprising:

a roller for feeding a film into a sensor;

a reflective sensor for detecting imperfections on a film;

a microprocessor connected to the sensor that determined an amount and extent of imperfections on the film and compares the determined amount and extent of imperfections to reference sensor readings; and

a router for separating film that is suitable for film processing from film that is not suitable for film processing based on a comparison of actual sensor readings to reference sensor readings by the microprocessor.

15. The defect detection system as recited in claim 14 , further comprising an output device to report the amount and extent of imperfections on the film.

16. The defect detection system as recited in claim 14 , further comprising a reference sensor and a memory, wherein the reference sensor readings are determined by the reference sensor and stored in the memory.

17. The defect detection system as recited in claim 14 , further comprising a tape dispenser positioned to repair the film if the imperfection detected by the sensor is a breakage in the film.

18. The defect detection system as recited in claim 14 , wherein the sensor detects the moisture level of the film.

19. The defect detection system as recited in claim 14 , wherein the sensor detects the moisture level of the film and if the moisture level is above a predetermined acceptable moisture level the film is dried until the moisture level drops below the predetermined acceptable moisture level.

20. The defect detection system as recited in claim 14 , wherein the sensor detects foreign objects on the film.

21. The defect detection system as recited in claim 14 , wherein the sensor detects foreign objects on the film and if the amount of foreign objects on the film is above a predetermined acceptable foreign object level the film is cleaned until the foreign object level drops below the predetermined acceptable foreign object level.

22. A method of identifying film suitable for digital image processing, the method comprising the steps of:

exposing a film to one or more light sources;

detecting light reflected from the film to measure imperfections on the film;

determining if the measured imperfections on the film exceed reference sensor readings; and

routing the film based on the sensor output depending on whether the film is suitable for digital film processing from film that is not suitable for digital film processing.

23. Me method as recited in claim 22 , further comprising the step of correcting the imperfection on the film by selecting a remedial measure that corrects the imperfection.

24. The method as recited in claim 23 , wherein the remedial measure comprises the step of removing excessive moisture from the film.

25. The method as recited in claim 23 , wherein the remedial measure comprises the step of removing foreign objects from the film.

26. The method as recited in claim 23 , wherein the remedial measure comprises the step of repairing one or more broken sprocket holes are repaired prior to digital film processing.

27. The method as recited in claim 23 , wherein the steps of exposing the film to one or more light sources, detecting the light reflected from the film to measure imperfections on the film, determining if the imperfections on the film exceed reference sensor readings, and correcting the imperfection on the film are repeated in an iterative manner.

28. The method as recited in claim 22 , further comprising the steps of:

determining the level of moisture in the film;

detecting foreign objects on the film; and

scanning for one or more broken sprocket holes on edges of the film, wherein an imperfection in the moisture level, a presence of foreign objects and broken sprocket holes will lead to rejection of the film from further digital film processing.

29. The method as recited in claim 22 , further comprising the step of rolling the film into a canister when the film is not suitable for digital film processing.

30. The method as recited in claim 22 , further comprising the step of reporting one or more reasons why the film is not suitable for digital film processing.

31. The method as recited in claim 30 , wherein the one or more reasons identify an imperfection type and a location on the film where the imperfection was detected.

32. The method as recited in claim 22 , further comprising the step of cleaning the film before the step of exposing the film to one or more light sources.

33. An imaging system comprising:

a defect detector comprising a defect sensor for detecting one or more imperfections on a photographic media, and a microprocessor connected to the defect sensor that determines an amount and extent of imperfections on the photographic media based on one or more reference sensor readings, said sensor and said microprocessor further enabling a determination of whether remedial measures can be taken to the media to make it suitable for image processing based on the amount and extent of determined imperfections as compared to the reference sensor readings;

at least one light source operable to illuminate the photographic media; and

at least one image sensor operable to detect light from the photographic media.