IP Library Granted Patent US 7,122,223
Granted Patent B1
US 7,122,223 · App. 09/786,412 · Granted Oct 17, 2006

Method for vacuum deposit on a curved substrate

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Quick Facts
Patent No.
US 7,122,223
App. No.
09/786,412
Granted
Oct 17, 2006
Kind
B1
Abstract

The invention concerns a method which consists in a process known per se in producing, on the curved substrate ( 10 ) to be treated, a film of material derived from a specific material source ( 13 ). The invention is characterized in that it consists in inserting, between the curved substrate ( 10 ) and the material source ( 13 ), a mask ( 19 ) relative to the curved substrate ( 10 ), preferably selecting as mask ( 19 ), a mask comprising a ring-shaped part ( 20 ). The invention is particularly useful for providing lenses with antiglare treatment.

Claims (44)

1. Process for the vacuum treatment of any curved substrate having a circular contour with a given diameter (D 1 ), comprising the steps of:

depositing a layer of material coming from a given source of material ( 13 ) on the curved substrate ( 10 ), while interposing a mask ( 19 ) between the curved substrate ( 10 ) and the source of material ( 13 ) at a certain distance from the curved substrate ( 10 ) and approximately parallel to the curved substrate, the mask being stationary with respect to the curved substrate ( 10 ), and

selecting the mask to have an annular part ( 20 ) with a diameter (D 2 ) between one quarter and twice the given diameter (D 1 ) of the curved substrate ( 10 );

wherein the certain distance is at least one tenth of, but less than twice, the diameter (D 1 ).

2. Process according to claim 1 , comprising the further step of selecting the mask to have a projection on a plane, in a direction perpendicular to the plane, with an area of less than 10% of the area of the projection of the curved substrate ( 10 ) on the plane.

3. Process according to claim 2 , comprising the further step of selecting the mask to have the projection with an area of less than 5% of the area of the projection of the curved substrate ( 10 ).

4. Process according to claim 1 , wherein the certain distance is less than half the diameter (D 1 ) of the curved substrate.

5. Process according to claim 1 , comprising the further steps of:

supporting the curved substrate ( 10 ) by a support ( 11 ), and

fastening the mask ( 19 ) to the support ( 11 ).

6. Process according to claim 1 , wherein a gas pressure of greater than 0.1 Pa is used in the depositing step.

7. Process according to claim 1 , comprising the further step of selecting the mask to have the annular part ( 20 ) have, in cross section, a height (H) greater than a radial thickness (E) of the annular part.

8. Process according to claim 7 , wherein the height (H) of the annular part ( 20 ) of the mask ( 19 ) is less than 15 mm.

9. Process according to claim 7 , wherein the height (H) of the annular part ( 20 ) of the mask ( 19 ) varies along a perimeter of the annular part.

10. Process according to claim 7 , wherein the mask consists of the annular part ( 20 ).

11. Process according to claim 7 , wherein the mask includes, on the outside of the annular part ( 20 ), at least one arm ( 25 ) which extends radially with respect to the annular part ( 20 ), in a cantilever fashion from the annular part.

12. Process according to claim 7 , wherein the cross section of the annular part ( 20 ) is generally rectangular.

13. Process according to claim 12 , comprising the further step of selecting the mask to include, inside the annular part ( 20 ), at least one crosspiece ( 24 ) which links together two regions of the annular part ( 20 ), the cross section of the crosspiece ( 24 ) being generally rectangular, and the cross section of the crosspiece extending approximately parallel to the cross section of the annular part ( 20 ),

wherein the cross section of the crosspiece and the cross section of the annular part are considered in the same cross section plane.

14. Process according to claim 7 , comprising the further step of selecting the mask to include, inside the annular part ( 20 ), at least one crosspiece ( 24 ) which links together two regions of the annular part ( 20 ).

15. Process according to claim 14 , wherein the crosspiece ( 24 ) extends along a diameter of the annular part ( 20 ).

16. Process according to claim 14 , wherein the mask includes at least two crosspieces ( 24 ).

17. Process according to claim 16 , wherein the two crosspieces ( 24 ) of the mask are perpendicular to each other.

18. Process according to claim 14 , wherein the mask includes, on the outside of the annular part ( 20 ), at least one arm ( 25 ) which extends radially with respect to the annular part ( 20 ), in a cantilever fashion from the annular part, along an extension of one crosspiece ( 24 ).

19. Process according to claim 18 , wherein the arm ( 25 ) and the crosspiece ( 24 ) have like cross-sections.

20. Process according to claim 18 , wherein the arm ( 25 ) is located at each of the ends of the crosspiece ( 24 ).

21. Process for the vacuum treatment of any curved substrate having a circular contour with a given diameter (D 1 ), comprising the steps of:

depositing a layer of material coming from a given source of material ( 13 ) on the curved substrate ( 10 ), while interposing a mask ( 19 ) between the curved substrate ( 10 ) and the source of material ( 13 ) at a certain distance from the curved substrate ( 10 ), the mask being stationary with respect to the curved substrate ( 10 ), and

selecting the mask to have an annular part ( 20 ) satisfying at least one of the following formulae:

d+H=A·D 2 /2  (I)

d=B·D 2 /2  (II)

D 1 =C·D 2   (III)

in which:

d is the distance between the mask ( 19 ) and the highest point of the treated curved substrate ( 10 );

H is the height of the annular part ( 20 ) of the mask ( 19 );

D 1 is the diameter of the curved substrate ( 10 );

D 2 is the diameter of the annular part ( 20 ) of the mask ( 19 );

A is a coefficient of between 0.8 and 1;

B is a coefficient of between 0.7 and 0.9;

and C is a coefficient of between 2 and 3.

22. Process according to claim 21 , wherein,

A is about 0.92;

B is about 0.77; and

C is about 2.5.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 6, 2018
From: ESSILOR INTERNATIONAL (COMPAGNIE GÉNÉRALE D'OPTIQUE)
To: ESSILOR INTERNATIONAL
Reel/Frame 045853/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2001
From: COMBLE, PASCAL; KELLER, GERHARD; MOUHOT, FREDERIC
To: ESSILOR INTERNATIONAL (COMPAGNIE GENERALE D'OPTIQUE)
Reel/Frame 012410/0580 →