Patent Application
Utility
App. No. 09/805,115
· Confirmation No. 2632
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TESTING METHOD THEREFOR
Inventor:
Yoshitaka Umeki
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-03-14 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-03-14 | A.PE |
Preliminary Amendment | 4 | View | |
| 2001-03-14 | SPEC |
Specification | 10 | View | |
| 2001-03-14 | CLM |
Claims | 3 | View | |
| 2001-03-14 | ABST |
Abstract | 1 | View | |
| 2001-03-14 | DRW |
Drawings-only black and white line drawings | 4 | View | |
| 2001-03-14 | OATH |
Oath or Declaration filed | 1 | View | |
| 2001-03-14 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-03-14 | A.PE |
Preliminary Amendment | 4 | View | |
| 2001-03-14 | SPEC |
Specification | 10 | View | |
| 2001-03-14 | CLM |
Claims | 3 | View | |
| 2001-03-14 | ABST |
Abstract | 1 | View | |
| 2001-03-14 | DRW |
Drawings-only black and white line drawings | 4 | View | |
| 2001-03-14 | OATH |
Oath or Declaration filed | 1 | View |
Inventors
Yoshitaka Umeki
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
324/765
Prosecution
- Examiner
- KARLSEN, ERNEST F
- Art Unit
- 2829
- Docket No.
- Q63395
- Confirmation No.
- 2632
Foreign Priority
203681/1997
·
1997-07-30
·
JAPAN
Publication
- Pub. No.
- US20010011905A1
- Pub. Date
- 2001-08-09
Patent Term Adjustment
0days
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-25
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Quick Facts
- App. No.
- 09/805,115
- Filed
- 2001-03-14
- Granted
- 2002-12-24
- Pub. No.
- US20010011905A1
- Examiner
- KARLSEN, ERNEST F
- Art Unit
- 2829
- PTA
- 0 days
External Links