Method and apparatus for testing digital circuitry
View Patent ↗Digital circuitry is tested through effecting a paired data loop-back from a first buffered output to a first buffered input whilst within the circuitry executing at least part of the test through using a Built-In-Self-Test methodology. In particular, the loop-back is effected from the first buffered data output to a buffered control input, from a buffered control output to the first buffered data input, or both. Advantageously, the buffering is associated to executing a conversion between a digital full swing internal signal and an analog low swing external signal with respect to core circuitry of the digital circuitry.
1. A method for testing digital circuitry comprising:
effecting a paired loop-back from a first buffered output to a first buffered input;
executing at least part of the test through using a Built-In-Self-Test methodology within the circuitry,
wherein the effecting step further comprises effecting said loop-back from the first buffered data output to a buffered control input, and wherein the method further comprises executing a conversion step between a digital full swing internal signal and an analog low swing external signal and a conversion step between an analog low swing signal and a digital full swing signal, with respect to core circuitry of said digital circuitry.
2. A method as claimed in claim 1 , characterized by effecting said loop-back from a buffered control output to the first buffered data input.
3. A method as claimed in claim 1 , wherein both said loop-back as well as said buffering are controlled through a one-bit control signal.
4. A method as claimed in claim 3 , wherein signal routing between said buffering on the one hand, and test circuitry as well as core circuitry of said digital circuitry, on the other hand, are controlled through a plural bit control signal.
5. A method for testing digital circuitry comprising:
effecting a paired data loop-back from a first buffered output to a first buffered input;
executing within the circuitry at least part of the test through using a Built-In-Self-Test methodology,
wherein the effecting step further comprises effecting said loop-back from a buffered control output to the first buffered data input, and wherein the method further comprises in connection with said buffering, executing a conversion step between a digital full swing internal signal and an analog low swing external signal and a conversion step between an analog low swing signal and a digital full swing signal, with respect to core circuitry of said digital circuitry.