IP Library Granted Patent US 7,258,706
Granted Patent B2
US 7,258,706 · App. 09/841,255 · Granted Aug 21, 2007

Abrasive particles for surface polishing

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Quick Facts
Patent No.
US 7,258,706
App. No.
09/841,255
Granted
Aug 21, 2007
Kind
B2
Abstract

Polishing compositions are described that are appropriate for fine polishing to very low tolerances. The polishing compositions include particles with small diameters with very narrow distributions in size and effectively no particles with diameters several times larger than the average diameter. Furthermore, the particles generally have very high uniformity with respect to having a single crystalline phase. Preferred particles have an average diameter less than about 200 nm. Laser pyrolysis processes are described for the production of the appropriate particles including metal oxides, metal carbides, metal sulfides, SiO 2 and SiC.

Claims (14)

1. A polishing composition comprising a dispersion of particles, the particles comprising a non-silicon metal compound and having an average particle diameter from about 5 nm to about 50 nm and a distribution of diameters such that at least about 95 percent of the particles have a diameter greater than about 60 percent of the average diameter and less than about 140 percent of the average diameter, wherein the non-silicon metal compound is selected from the group consisting of Fe 2 O 3 , Fe 3 O 4 , MoS 2 , MoO 2 , WC, WO 3 and WS 2 .

2. The polishing composition of claim 1 wherein the particles are dispersed in an aqueous solution.

3. The polishing composition of claim 1 wherein the particles are dispersed in a nonaqueous solution.

4. The polishing composition of claim 1 having a single crystalline phase with a uniformity of at least about 90 percent by weight.

5. The polishing composition of claim 4 wherein the particles have a single crystalline phase with a uniformity of at least about 95 percent by weight.

6. The polishing composition of claim 4 wherein the particles have a single crystalline phase with a purity of at least about 99 percent by weight.

7. The polishing composition of claim 4 wherein the particles have a single crystalline phase with a purity of at least about 99.9 percent by weight.

8. A polishing composition comprising a dispersion of particles, the particles comprising a non-silicon metal compound with an average particle diameter from about 5 nm to about 50 nm, wherein less than about 1 particle in 10 6 has a diameter greater than about five times the average diameter, wherein the non-silicon metal compound is selected from the group consisting of Fe 2 O 3 , Fe 3 O 4 , MoS 2 , MoO 2 , WC, WO 3 and WS 2 .

9. The polishing composition of claim 8 wherein the particles are dispersed in an aqueous solution.

10. The polishing composition of claim 8 wherein the particles are dispersed in a nonaqueous solution.

11. A polishing composition comprising a dispersion of particles, the particles comprising SiC with an average particle diameter from about 5 nm to about 50 nm, wherein less than about 1 particle in 10 6 has a diameter greater than about five times the average diameter.

12. The polishing composition of claim 11 wherein the particles are dispersed in an aqueous solution.

13. The polishing composition of claim 11 wherein the particles are dispersed in a nonaqueous solution.

14. The polishing composition of claim 11 having a single crystalline phase with a uniformity of at least about 90 percent by weight.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 24, 2001
From: KAMBE, NOBUYUKI; BI, XIANGXIN
To: NANOGRAM CORPORATION
Reel/Frame 012089/0565 →