Granted Patent
Utility
US 6,556,491
· Confirmation No. 1401
SEMICONDUCTOR STORAGE DEVICE AND METHOD OF TESTING THE SAME
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2019-03-18 | OATH |
Oath or Declaration filed | 7 | View | |
| 2001-06-01 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-06-01 | SPEC |
Specification | 16 | View | |
| 2001-06-01 | CLM |
Claims | 6 | View | |
| 2001-06-01 | ABST |
Abstract | 1 | View | |
| 2001-06-01 | DRW |
Drawings-only black and white line drawings | 11 | View | |
| 2001-06-01 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Hidefumi Otsuka
Osaka, JAPAN
Yuji Yamasaki
Osaka, JAPAN
Attorneys & Agents of Record
Classification
USPC
365/201
Prosecution
- Examiner
- LAM, DAVID
- Art Unit
- 2818
- Docket No.
- MAT-8131US
- Confirmation No.
- 1401
Foreign Priority
2000-164301
·
2000-06-01
·
JAPAN
Publication
- Pub. No.
- US20020040989A1
- Pub. Date
- 2002-04-11
Patent Term Adjustment
-94days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2019-03-18
CHANGE OF NAME
Recorded 2018-04-16
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-12-27
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Quick Facts
- Patent No.
- US 6,556,491
- App. No.
- 09/871,932
- Filed
- 2001-06-01
- Granted
- 2003-04-29
- Pub. No.
- US20020040989A1
- Examiner
- LAM, DAVID
- Art Unit
- 2818
- PTA
- -94 days
External Links