Systems and methods for testing wireless devices
View Patent ↗Systems and methods are disclosed for parallel testing one or more wireless devices using a single wireless command, each device including a processor and memory coupled to the processor. The system includes a tester adapted to exercise the wireless devices, including: a transceiver adapted to communicate with each wireless device; and a computer coupled to the transceiver, the computer adapted to test all wireless devices in parallel by issuing a single test command using a wireless signal, the computer adapted to store test patterns and test results.
1. A method comprising:
wirelessly receiving a single test command on a plurality of wireless devices formed on a wafer via radio frequency circuitry of each of the plurality of wireless devices operable in a test mode and normal operation; and
simultaneously testing the plurality of wireless devices in response to receiving the single test command.
2. The method of claim 1 , further comprising switching all of the plurality of wireless devices on to wirelessly receive the single test command.
3. The method of claim 2 , further comprising switching on a transistor coupled to each of the plurality of wireless devices to switch all of the plurality of wireless devices on.
4. The method of claim 1 , further comprising wirelessly receiving the single test command without an antenna coupled to the plurality of wireless devices.
5. The method of claim 4 , further comprising wirelessly receiving the single test command via one or more pads formed on each of the plurality of wireless devices.
6. The method of claim 4 , further comprising wirelessly receiving the single test command via a power line formed on each of the plurality of wireless devices.
7. The method of claim 1 , further comprising communicating with individual ones of the plurality of wireless devices regarding test results.
8. The method of claim 7 , further comprising communicating with the individual ones of the plurality of wireless devices based on a unique identifier.
9. The method of claim 1 , further comprising eliminating any of the plurality of the wireless devices that does not identify itself in response to the single test command.
10. The method of claim 9 , further comprising next eliminating any of the plurality of wireless devices that fail a volatile memory test.
11. The method of claim 10 , further comprising next eliminating any of the plurality of wireless devices that fail a digital circuitry test.
12. The method of claim 11 , further comprising next eliminating any of the plurality of wireless devices that fail a mixed signal interface test.
13. A system comprising:
a test unit to issue a single test command for transmission to a plurality of wireless devices formed on a wafer, the single test command to cause testing of the plurality of wireless devices via radio frequency circuitry of each of the plurality of wireless devices operable in a test mode and normal operation of the wireless device in parallel; and
an antenna coupled to the test unit to wirelessly transmit the single test command for receipt by the plurality of wireless devices.
14. The system of claim 13 , further comprising a wafer sorter coupled to the test unit.
15. The system of claim 13 , wherein the test unit is configured to selectively address selected ones of the plurality of wireless devices to receive test results therefrom.
16. The system of claim 15 , wherein the system is configured to provide power in parallel to the plurality of wireless devices via a single power pad on the wafer.
17. An apparatus comprising:
a wafer having a plurality of wireless devices formed thereon, wherein each of the plurality of wireless devices comprises an analog portion including a cellular radio core and a short-range wireless transceiver core coupled to the cellular radio core and a digital portion including a processor coupled to the cellular radio core and the short-range wireless transceiver core to handle a plurality of wireless communication protocols and a memory coupled to the processor, the wafer comprising:
a power pad coupled to each of the plurality of wireless devices to provide a power supply voltage thereto during a test operation; and
a ground pad coupled to each of the plurality of wireless devices to provide a reference voltage thereto during the test operation.
18. The apparatus of claim 17 , further comprising a plurality of transistors, each coupled to provide the power supply voltage to a corresponding one of the plurality of wireless devices under control of a voltage on a bit pad.
19. The apparatus of claim 17 , wherein each of the wireless devices is configured to directly receive a test command from a tester wirelessly.
20. The apparatus of claim 17 , wherein the short-range wireless transceiver core is configured to wirelessly receive signals from a tester without a dedicated antenna.