IP Library Granted Patent US 7,033,637
Granted Patent B1
US 7,033,637 · App. 09/889,237 · Granted Apr 25, 2006

Epitaxial thin films

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Quick Facts
Patent No.
US 7,033,637
App. No.
09/889,237
Granted
Apr 25, 2006
Kind
B1
Abstract

Epitatial thin films for use as buffer layers for high temperature superconductors, electrolytes in solid oxide fuel cells (SOFC), gas separation membranes or dielectric material in electronic devices, are disclosed. By using CCVD, CACVD or any other suitable deposition process, epitaxial films having pore-free, ideal grain boundaries, and dense structure can be formed. Several different types of materials are disclosed for use as buffer layers in high temperature superconductors. In addition, the use of epitaxial thin films for electrolytes and electrode formation in SOFCs results in densification for pore-free and ideal gain boundary/interface microstructure. Gas separation membranes for the production of oxygen and hydrogen are also disclosed. These semipermeable membranes are formed by high-quality, dense, gas-tight, pinhole free sub-micro scale layers of mixed-conducting oxides on porous ceramic substrates. Epitaxial thin films as dielectric material in capacitors are also taught herein. Capacitors are utilized according to their capacitance values which are dependent on their physical structure and dielectric permittivity. The epitaxial thin films of the current invention form low-loss dielectric layers with extremely high permittivity. This high permittivity allows for the formation of capacitors that can have their capacitance adjusted by applying a DC bias between their electrodes.

Claims (3)

1. A method of making a dielectric layer between a pair of opposing electrodes comprising the steps of: forming, as said dielectric layer, an epitaxial thin film on a textured substrate; forming one of said electrodes on an exposed surface of said thin film; wholly or partially removing said textured substrate; and forming an electrical connection to access said dielectric layer on the side of said textured substrate.

2. The method according to claim 1 wherein the textured substrate comprises nickel.

3. The method according to claim 1 wherein said epitaxial thin film is formed from perovskite.

Assignments (1)
SECURITY INTEREST Recorded Jan 12, 2004
From: MICROCOATING TECHNOLOGIES, INC.
To: SILICON VALLEY BANK
Reel/Frame 014901/0263 →