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App. No. 09/896,652 · Confirmation No. 8528

APPARATUS FOR SWEEP SYNCHRONIZATION MEASUREMENT OF OPTICAL WAVELENGTH SENSITIVITY CHARACTERISTICS AND METHOD OF CORRECTING OPTICAL WAVELENGTH SENSITIVITY THEREOF

Inventor: Kiyohisa Fujita
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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2006-01-20 WFEE Fee Worksheet (SB06) 1 View
2003-11-20 IFEE Issue Fee Payment (PTO-85B) 3 View
2003-07-23 A.NE Response After Final Action 5 View
2003-07-23 XT/ Extension of Time 1 View
2001-09-11 TRNA Transmittal of New Application 4 View
2001-09-11 DRW Drawings-only black and white line drawings 2 View
2001-06-29 TRNA Transmittal of New Application 2 View
2001-06-29 SPEC Specification 15 View
2001-06-29 CLM Claims 3 View
2001-06-29 ABST Abstract 1 View
2001-06-29 DRW Drawings-only black and white line drawings 2 View
2001-06-29 OATH Oath or Declaration filed 3 View
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Quick Facts
App. No.
09/896,652
Filed
2001-06-29
Granted
2004-02-03
Pub. No.
US20020008194A1
Art Unit
2878
PTA
-41 days