Patent Application
Utility
App. No. 09/911,342
· Confirmation No. 3416
SEMICONDUCTOR TEST APPARATUS WITH REDUCED POWER CONSUMPTION AND HEAT GENERATION
Inventor:
Nobuaki Takeuchi
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-07-23 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-07-23 | SPEC |
Specification | 24 | View | |
| 2001-07-23 | CLM |
Claims | 6 | View | |
| 2001-07-23 | ABST |
Abstract | 1 | View | |
| 2001-07-23 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2001-07-23 | OATH |
Oath or Declaration filed | 3 | View |
Inventors
Nobuaki Takeuchi
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
324/765
G01R31/2851
G01R31/2822
G01R31/31721
Prosecution
- Examiner
- TANG, MINH NHUT
- Art Unit
- 2829
- Customer No.
- 7278
- Docket No.
- 6920/0J634
- Confirmation No.
- 3416
Foreign Priority
P2000-225862
·
2000-07-26
·
JAPAN
Publication
- Pub. No.
- US20020043987A1
- Pub. Date
- 2002-04-18
Patent Term Adjustment
-40days
No related applications found.
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2005-04-06
from
TAKEUCHI, NOBUAKI
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-10-29
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Quick Facts
- App. No.
- 09/911,342
- Filed
- 2001-07-23
- Granted
- 2003-09-02
- Pub. No.
- US20020043987A1
- Examiner
- TANG, MINH NHUT
- Art Unit
- 2829
- PTA
- -40 days
External Links