Flat panel display unit and method of repairing defects in its line pattern
View Patent ↗Shorting defects between the scan lines and signal lines are repaired during the manufacture of a TFT or other flat panel display unit without causing liquid crystal orientation defects and production yield is thereby improved. In a TFT panel in which scan line 2 bifurcates where scan line 2 and signal line 3 intersect, the lines having a protective insulation film 8 therebetween, one leg of the scan line 2 bifurcation is cut by a laser 9 where a short 7 has been found between lines at the intersection, thereby electrically separating the short. An insulation film material 13 dispensed from a glass pipette 12 is then applied locally to the cut part and surrounding area and cured to form a new insulation film.
1. A method for repairing line defects in a flat panel display having a branch of at least a scan line or a signal line at an intersectional region between the scan line and the signal line, the method comprising:
detecting a shorting defect between a scan line and signal line disposed with an interlayer insulation film therebetween and identifying the location of the shorting defect,
forming an organic insulating layer to cover the intersectional region with a shorting defect locally; and
cutting the branch at two regions as to sandwich the shorting defect using a laser beam before curing the organic insulation film.
2. A method for repairing line defects as described in claim 1 , wherein the flat panel display unit is a liquid crystal display panel.
3. A method for repairing line defects as described in claim 1 , wherein the organic insulation film includes a material selected from the group consisting of silicon oxide resin, polyimide resin, epoxy resin, and acrylic resin.
4. A method for repairing line defects as described in claim 1 , further comprising forming an organic insulation film on to the repaired portion.
5. A method for repairing line defects in a flat panel display having a branch of a scan line at an intersectional region between the scan line and a signal line, the method comprising:
detecting a shorting defect between a scan line and the signal line disposed with an interlayer insulation film therebetween;
storing the position of the detected shorting defect;
supplying an organic insulating material to cover the intersectional region with a shorting defect locally;
severing the scan line at two regions near the stored position of the shorting defect with a laser beam before curing the organic insulation material; and
forming an organic insulation film on to the repaired portion.
6. A method for repairing line defects as described in claim 5 , in which a shorting defect between the scan line and the signal line is detected by applying a voltage between the scan line and the signal line and then detecting an infrared signal being produced at the position of the shorting defect using an infrared detector.