Granted Patent
Utility
US 6,532,570
· Confirmation No. 7291
DESIGNING INTEGRATED CIRCUITS TO REDUCE TEMPERATURE INDUCED ELECTROMIGRATION EFFECTS
Inventor:
Hendrik T. Mau
Patented Case
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-09-07 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-09-07 | SPEC |
Specification | 17 | View | |
| 2001-09-07 | CLM |
Claims | 13 | View | |
| 2001-09-07 | ABST |
Abstract | 1 | View | |
| 2001-09-07 | DRW |
Drawings-only black and white line drawings | 13 | View | |
| 2001-09-07 | OATH |
Oath or Declaration filed | 2 | View |
Inventors
Hendrik T. Mau
Santa Clara, CA
Attorneys & Agents of Record
Classification
USPC
716/2
G06F30/367
G01R31/318357
G01R31/2858
G01R31/318371
Prosecution
- Examiner
- DINH, PAUL
- Art Unit
- 2825
- Docket No.
- SP-6455 US
- Confirmation No.
- 7291
Patent Term Adjustment
0days
No related applications found.
MERGER AND CHANGE OF NAME
Recorded 2015-12-12
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Quick Facts
- Patent No.
- US 6,532,570
- App. No.
- 09/949,067
- Filed
- 2001-09-07
- Granted
- 2003-03-11
- Examiner
- DINH, PAUL
- Art Unit
- 2825
- PTA
- 0 days
External Links