IP Library Granted Patent US 6,956,797
Granted Patent B2
US 6,956,797 · App. 09/950,413 · Granted Oct 18, 2005

Digital servo system with error signal integrity testing

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 6,956,797
App. No.
09/950,413
Granted
Oct 18, 2005
Kind
B2
Abstract

A sample integrity test is disclosed. The sample integrity test receives an error signal and a defect signal. If the defect signal indicates the presence of a defect, a low-pass filtered error signal is substituted for the error signal. The low-pass filtered error signal is the error signal filtered with a low-pass filter. The error signal can be derived from optical signals from an optical pick-up unit. A control signal generated from the output signal from the sample integrity test controls the position of the optical pick-up unit. The defect signal can also be derived from the optical signals.

Claims (29)

1. A method of performing a signal integrity test in a servo system, comprising: generating an error signal; detecting presence of a defect; and substituting a low pass filtered version of the error signal for the error signal when the defect is detected.

2. The method of claim 1 , wherein detecting presence of the defect includes receiving a defect signal from a defect detector.

3. The method of claim 2 , wherein the defect signal is generated by obtaining a sum signal; obtaining a high pass filtered sum signal from the sum signal; indicating presence of the defect when the high-pass filtered sum signal exceeds a threshold value.

4. The method of claim 3 , wherein obtaining the sum signal includes receiving optical signals from at least one detector in an optical pick-up unit; calculating the sum of the optical signals.

5. The method of claim 1 , wherein detecting presence of the defect includes detecting a peak in the error signal.

6. The method of claim 5 , wherein the peak can be detected by low pass integrating the error signal to form an integration signal; indicating presence of the defect when the integration signal exceeds a threshold value.

7. The method of claim 1 , wherein detecting presence of the defect includes comparing the error signal between two cycles; and indicating presence of the defect when the difference between the error signal in the two cycles is greater than a threshold value.

8. The method of claim 7 , wherein the two cycles are consecutive cycles.

9. The method of claim 1 , wherein the error signal is a focus error signal.

10. The method of claim 9 , wherein generating the error signal includes: receiving optical signals from an optical pick-up unit with at least one detector, each of the at least one detector including a central element and two side elements; and calculating the difference between the sum of the optical signals from the two side elements and the optical signal from the central element.

11. The method of claim 1 , wherein the error signal is a tracking error signal.

12. The method of claim 11 , wherein generating the error signal includes: receiving optical signals from an optical pick-up unit with at least one detector, each of the at least one detector including a central element and two side elements; and calculating the difference between the optical signals from the two side elements.

13. The method of claim 1 , further including providing a count of the number of times that the low-pass filtered error signal is substituted for the error signal.

14. The method of claim 13 , wherein an error is indicated if the count is too high.

15. A method of calculating a control signal, comprising: receiving optical signals from an optical pick-up unit; generating an error signal from the optical signals; determining whether a defect criteria is present; substituting a low pass filtered error signal for the error signal if the defect criteria is present to generate an output signal; and generating the control signal from the output signal.

16. The method of claim 15 wherein the error signal is a focus error signal.

17. The method of claim 15 wherein the error signal is a tracking error signal.

18. The method of claim 15 , further including indicating an error position if the low-pass filtered error signal is substituted for the error signal a number of times exceeding an allowable number.

19. The method of claim 15 , wherein determining whether the defect criteria is present includes receiving a defect signal from a defect detector.

20. The method of claim 15 , wherein determining whether the defect criteria is present includes detecting a peak in the error signal.

21. The method of claim 15 , wherein determining whether the defect criteria is present includes comparing the difference between the error signal from a first cycle to the error signal from a second cycle with a threshold value.

22. The method of claim 21 , wherein the first cycle and the second cycle are adjacent cycles.

23. A servo system, comprising: an optical pick-up unit; at least one processor coupled to receive digitized optical signals from the optical pick-up unit, the processor calculating a control signal; and a driver coupled to control the position of the optical pick-up unit in response to the control signal, wherein the at least one processor executes an algorithm that generates an error signal; detects presence of a defect; and substitutes a low pass filtered version of the error signal for the error signal when the defect is detected.

24. The method of claim 23 , wherein presence of the defect can be detected by receiving a defect signal from a defect detector.

25. The method of claim 23 , wherein presence of the defect can be detected by detecting a peak in the error signal.

26. The method of claim 23 , wherein presence of the defect can be detected by comparing the error signal between two cycles; and indicating presence of the defect when the difference between the error signal in the two cycles is greater than a threshold value.

27. The method of claim 26 , wherein the two cycles are consecutive cycles.

28. The method of claim 23 , wherein the error signal is a focus error signal.

29. The method of claim 23 , wherein the error signal is a tracking error signal.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 13, 2018
From: OPTICAL DEVICES, LLC
To: RPX CORPORATION
Reel/Frame 046064/0248 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2018
From: OPTICAL DEVICES, LLC
To: RPX CORPORATION
Reel/Frame 046111/0191 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 12, 2012
From: OD TECHNOLOGIES, LLC
To: OD SERVO TECHNOLOGIES, LLC
Reel/Frame 028941/0347 →