IP Library Granted Patent US 6,999,290
Granted Patent B1
US 6,999,290 · App. 09/959,466 · Granted Feb 14, 2006

Integrated circuit with protection against electrostatic damage

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Quick Facts
Patent No.
US 6,999,290
App. No.
09/959,466
Granted
Feb 14, 2006
Kind
B1
Abstract

An IC having inputs and outputs for a plurality of frequency bands from a high frequency band to a low frequency band is protected from electrostatic damage. A high-frequency section of the IC is provided with a protection circuit including diode-connected transistors connected by multiple stages. In addition, there are applied the transistors in which elements thereof are isolated by insulator that can prevent thyristor operation.

Claims (13)

1. A semiconductor integrated circuit having different circuits operative at different frequencies, respectively, and having a plurality of input and output terminals for said circuits, comprising at least two or more kinds of protection circuits against electrostatic discharge having different electrical characteristics corresponding to the different circuits.

2. The semiconductor integrated circuit according to claim 1 , wherein the protection circuits against electrostatic discharge have different breakdown voltage.

3. A semiconductor integrated circuit according to claim 1 , wherein the different circuits include a high-frequency section and a lower-frequency section, and wherein the sections have protection circuits against electrostatic discharge that have different electrical characteristics.

4. A semiconductor integrated circuit according to claim 3 , wherein the protection circuit of the high-frequency section is constructed by diodes connected in series and reversely biased between a power source terminal and a ground terminal.

5. A semiconductor integrated circuit according to claim 4 , wherein the diodes are diode-connected bipolar transistors.

6. A semiconductor integrated circuit according to claim 3 , wherein the semiconductor integrated circuit is a one-chip integrated circuit integrating the high-frequency section and the lower-frequency section, the protection circuit of the lower-frequency section comprises one stage of diode-connected transistors, and the protection circuit of the high-frequency section comprises diode-connected transistors connected in series by multiple stages.

7. A semiconductor integrated circuit having a plurality of input and output terminals, comprising at least two or more kinds of protection circuits against electrostatic discharge having different electrical characteristics, wherein the protection circuits against electrostatic discharge have different parasitic capacitances viewed from the input and output terminals.

8. The semiconductor integrated circuit according to claim 7 , including a first protection circuit against electrostatic discharge having diode-connected transistors by 1 stage and a second protection circuit against electrostatic discharge having diode-connected transistors connected in series by multiple stages, the second protection circuit against electrostatic discharge being provided in the output of a circuit of an output signal exceeding the power source voltage.

9. The semiconductor integrated circuit according to claim 7 , including a circuit operating when an input potential exceeds a negative ON voltage, and a protection circuit against electrostatic discharge provided in the input of the circuit consisting of diode-connected transistors isolated electrically by the barrier of an insulator which are connected in series by multiple stages.

10. The semiconductor integrated circuit according to claim 7 , further comprising including a first protection circuit against electrostatic discharge having diode-connected transistors by 1 stage and a second protection circuit against electrostatic discharge having diode-connected transistors connected in series by multiple stages, the second protection circuit against electrostatic discharge being provided in the output of a circuit of an output signal exceeding the power source voltage.

11. The semiconductor integrated circuit according to claim 7 , including a circuit operating when an input potential exceeds a negative ON voltage, and a protection circuit against electrostatic discharge provided in the input of the circuit consisting of diode-connected transistors isolated electrically by the barrier of an insulator which are connected in series by multiple stages.

12. A semiconductor integrated circuit comprising, in one chip, an intermediate-frequency circuit, a first protection circuit against electrostatic discharge having diode-connected transistors by 1 stage between the output of the intermediate-frequency circuit and the power source or the ground, a high-frequency circuit, and a second protection circuit against electrostatic discharge having diode-connected transistors connected in series by multiple stages between the input of the high-frequency circuit and at least one of the power source and the ground.

13. The semiconductor integrated circuit according to claim 12 , wherein said transistors connected in series by multiple stages are discretely and electrically isolated by the barrier of an insulator.

Assignments (5)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
CHANGE OF NAME Recorded Sep 9, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024973/0099 →
MERGER Recorded Sep 9, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024982/0040 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2003
From: HITACHI, LTD.
To: RENESAS TECHNOLOGY CORPORATION
Reel/Frame 014244/0278 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 26, 2001
From: TAKIKAWA, KUMIKO; TANAKA, SATOSHI
To: HITACHI, LTD.
Reel/Frame 012436/0638 →