Patent Application
Utility
App. No. 09/983,695
· Confirmation No. 1060
SEALING METHOD OF LIQUID CRYSTAL DISPLAY PANEL AND SEALING APPARATUS FOR LIQUID CRYSTAL DISPLAY PANEL
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-10-13 | CTMS |
Miscellaneous Action with shortened statutory period (SSP) | 2 | View | |
| 2004-10-13 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-06-23 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-05-24 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2004-05-24 | FOR |
Foreign Reference | 18 | View | |
| 2004-03-25 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 8 | View | |
| 2004-03-25 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-03-25 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-03-25 | CLM |
Claims | 9 | View | |
| 2004-03-25 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-03-25 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-03-25 | FWCLM |
Index of Claims | 1 | View | |
| 2004-03-15 | SRNT |
Examiner's search strategy and results | 4 | View | |
| 2004-03-12 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2004-01-12 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-01-12 | FWCLM |
Index of Claims | 1 | View | |
| 2003-12-16 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 2 | View | |
| 2003-12-16 | CLM |
Claims | 8 | View | |
| 2003-12-16 | REM |
Applicant Arguments/Remarks Made in an Amendment | 5 | View | |
| 2003-12-02 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2003-12-02 | FOR |
Foreign Reference | 17 | View | |
| 2003-10-03 | CTNF |
Non-Final Rejection | 11 | View | |
| 2003-10-03 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-10-03 | FOR |
Foreign Reference | 10 | View | |
| 2003-10-03 | FOR |
Foreign Reference | 7 | View | |
| 2003-10-03 | FOR |
Foreign Reference | 7 | View | |
| 2003-10-03 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-09-18 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2003-09-17 | SRNT |
Examiner's search strategy and results | 8 | View | |
| 2003-06-26 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2003-06-26 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-06-26 | CLM |
Claims | 1 | View | |
| 2003-06-26 | REM |
Applicant Arguments/Remarks Made in an Amendment | 4 | View | |
| 2003-06-26 | XT/ |
Extension of Time | 1 | View | |
| 2003-06-26 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2003-06-26 | FRPR |
Certified Copy of Foreign Priority Application | 57 | View | |
| 2003-06-09 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 4 | View | |
| 2002-12-26 | CTNF |
Non-Final Rejection | 7 | View | |
| 2002-12-26 | 892 |
List of references cited by examiner | 1 | View | |
| 2002-12-26 | FOR |
Foreign Reference | 2 | View | |
| 2002-12-26 | FOR |
Foreign Reference | 2 | View | |
| 2002-12-26 | FOR |
Foreign Reference | 2 | View | |
| 2002-12-26 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2002-12-20 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2002-12-19 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2001-12-03 | LET. |
Miscellaneous Incoming Letter | 1 | View | |
| 2001-12-03 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2001-12-03 | A.PE |
Preliminary Amendment | 1 | View | |
| 2001-12-03 | SPEC |
Specification | 2 | View | |
| 2001-12-03 | CLM |
Claims | 1 | View | |
| 2001-12-03 | REM |
Applicant Arguments/Remarks Made in an Amendment | 4 | View | |
| 2001-10-25 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-10-25 | SPEC |
Specification | 27 | View | |
| 2001-10-25 | CLM |
Claims | 4 | View | |
| 2001-10-25 | ABST |
Abstract | 1 | View | |
| 2001-10-25 | DRW |
Drawings-only black and white line drawings | 17 | View | |
| 2001-10-25 | OATH |
Oath or Declaration filed | 3 | View | |
| 2001-10-25 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2001-10-25 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2001-10-25 | FWCLM |
Index of Claims | 1 | View | |
| 2001-10-25 | TRNA |
Transmittal of New Application | 1 | View | |
| 2001-10-25 | DRW |
Drawings-only black and white line drawings | 17 | View | |
| 2001-10-25 | SPEC |
Specification | 27 | View | |
| 2001-10-25 | CLM |
Claims | 4 | View | |
| 2001-10-25 | ABST |
Abstract | 1 | View | |
| 2001-10-25 | OATH |
Oath or Declaration filed | 3 | View | |
| 2001-10-25 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-10-25 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-10-25 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2001-10-25 | FRPR |
Certified Copy of Foreign Priority Application | 43 | View | |
| 2001-10-25 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2001-10-25 | FOR |
Foreign Reference | 6 | View |
Inventors
Eiichirou Aoki
Tokyo, JAPAN
Tsutomu Uemura
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
349/190
Prosecution
- Examiner
- DI GRAZIO, JEANNE A
- Art Unit
- 2871
- Docket No.
- Q66659
- Confirmation No.
- 1060
Foreign Priority
2000-329848
·
2000-10-30
·
JAPAN
Publication
- Pub. No.
- US20020054271A1
- Pub. Date
- 2002-05-09
Patent Term Adjustment
-212days
No related applications found.
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-06-04
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-10-25
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Quick Facts
- App. No.
- 09/983,695
- Filed
- 2001-10-25
- Granted
- 2004-11-30
- Pub. No.
- US20020054271A1
- Examiner
- DI GRAZIO, JEANNE A
- Art Unit
- 2871
- PTA
- -212 days
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