Granted Patent
Utility
US 6,773,853
· Confirmation No. 2966
SEMICONDUCTOR DEVICE MANUFACTURE METHOD WITH EXPOSURE PROCESS USING SMALL EXPOSURE AMOUNT, AND RETICLE SET FOR SEMICONDUCTOR DEVICE MANUFACTURE
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-06-22 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-04-29 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-04-29 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 5 | View | |
| 2004-04-29 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-04-29 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-04-19 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2004-02-24 | AMSB |
Amendment Submitted/Entered with Filing of Continued Prosecution Application (CPA)/Request for Continued Examination(RCE) | 1 | View | |
| 2004-02-24 | DRW |
Drawings-only black and white line drawings | 1 | View | |
| 2004-02-24 | CLM |
Claims | 14 | View | |
| 2004-02-24 | REM |
Applicant Arguments/Remarks Made in an Amendment | 5 | View | |
| 2004-02-24 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2004-02-24 | XT/ |
Extension of Time | 1 | View | |
| 2004-02-24 | RCEX |
Request for Continued Examination (RCE) | 2 | View | |
| 2003-11-04 | CTFR |
Final Rejection | 13 | View | |
| 2003-08-20 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-08-20 | CLM |
Claims | 13 | View | |
| 2003-08-20 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2003-06-03 | CTNF |
Non-Final Rejection | 10 | View | |
| 2003-06-03 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-05-20 | SRNT |
Examiner's search strategy and results | 2 | View | |
| 2001-11-01 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-11-01 | SPEC |
Specification | 20 | View | |
| 2001-11-01 | CLM |
Claims | 13 | View | |
| 2001-11-01 | ABST |
Abstract | 1 | View | |
| 2001-11-01 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2001-11-01 | OATH |
Oath or Declaration filed | 5 | View | |
| 2001-11-01 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2001-11-01 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2001-11-01 | FWCLM |
Index of Claims | 1 | View | |
| 2001-11-01 | TRNA |
Transmittal of New Application | 3 | View | |
| 2001-11-01 | DRW |
Drawings-only black and white line drawings | 8 | View | |
| 2001-11-01 | SPEC |
Specification | 20 | View | |
| 2001-11-01 | CLM |
Claims | 13 | View | |
| 2001-11-01 | ABST |
Abstract | 1 | View | |
| 2001-11-01 | OATH |
Oath or Declaration filed | 5 | View | |
| 2001-11-01 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-11-01 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2001-11-01 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View | |
| 2001-11-01 | FRPR |
Certified Copy of Foreign Priority Application | 43 | View |
Inventors
Takayoshi Minami
Kawasaki, JAPAN
Toshio Sawano
Kasugai, JAPAN
Attorneys & Agents of Record
Classification
USPC
430/5
Prosecution
- Examiner
- SAGAR, KRIPA
- Art Unit
- 1756
- Customer No.
- 23850
- Docket No.
- 011387
- Confirmation No.
- 2966
Foreign Priority
2001-161999
·
2001-05-30
·
JAPAN
Publication
- Pub. No.
- US20020182545A1
- Pub. Date
- 2002-12-05
Patent Term Adjustment
0days
No related applications found.
CHANGE OF ADDRESS
Recorded 2016-12-23
CHANGE OF NAME
Recorded 2010-08-02
from
FUJITSU LIMITED
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2008-12-05
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-11-01
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Quick Facts
- Patent No.
- US 6,773,853
- App. No.
- 09/985,004
- Filed
- 2001-11-01
- Granted
- 2004-08-10
- Pub. No.
- US20020182545A1
- Examiner
- SAGAR, KRIPA
- Art Unit
- 1756
- PTA
- 0 days
External Links