Granted Patent
Utility
US 6,514,878
· Confirmation No. 5062
METHOD OF FABRICATING A SEMICONDUCTOR DEVICE HAVING A MULTILAYERED INTERCONNECTION STRUCTURE
Inventor:
Hirofumi Watatani
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2001-12-03 | TRNA |
Transmittal of New Application | 4 | View | |
| 2001-12-03 | A.PE |
Preliminary Amendment | 11 | View | |
| 2001-12-03 | SPEC |
Specification | 17 | View | |
| 2001-12-03 | CLM |
Claims | 5 | View | |
| 2001-12-03 | ABST |
Abstract | 1 | View | |
| 2001-12-03 | DRW |
Drawings-only black and white line drawings | 12 | View | |
| 2001-12-03 | OATH |
Oath or Declaration filed | 5 | View |
Inventors
Hirofumi Watatani
Kawasaki-shi, JAPAN
Attorneys & Agents of Record
Classification
USPC
438/769
H10W20/087
H10P14/6922
H10P14/662
H10W20/088
H10P14/6336
H10W20/086
H10P14/6342
H10P14/69215
H10W20/071
Prosecution
- Examiner
- NGUYEN, DAO H
- Art Unit
- 2818
- Customer No.
- 23850
- Docket No.
- 990669B
- Confirmation No.
- 5062
Foreign Priority
10-292515
·
1998-10-14
·
JAPAN
Publication
- Pub. No.
- US20020039840A1
- Pub. Date
- 2002-04-04
Patent Term Adjustment
-151days
CHANGE OF ADDRESS
Recorded 2016-12-23
CHANGE OF NAME
Recorded 2010-08-02
from
FUJITSU LIMITED
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2008-12-05
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Quick Facts
- Patent No.
- US 6,514,878
- App. No.
- 09/998,236
- Filed
- 2001-12-03
- Granted
- 2003-02-04
- Pub. No.
- US20020039840A1
- Examiner
- NGUYEN, DAO H
- Art Unit
- 2818
- PTA
- -151 days
External Links