Methods to view and analyze the results from diffraction-based diagnostics
View Patent ↗An analyzer useful in determining the presence of an analyte using a diffraction based sensing device and methods and systems using this device. The present invention may be used with a variety of different diffraction-based diagnostic methods and systems. The analyzer enhances the accuracy and/or usefulness of these devices in detecting analytes, while providing more ease-of-use and convenience to the user. The analyzer may include a light source, a photodiode, a microprocessor and a display system for informing the user of the result. Other features include mirrors, lenses, a sample holder, and a mask for blocking out some light. The analyzer and related method and system may be used in a large number of environments, including commercial, professional, and individual.
1. A method for detecting an analyte in a sample comprising:
providing a substrate that contains a patterned receptor layer, the receptor layer containing a receptor material;
binding the analyte to the patterned receptor layer on the substrate;
contacting the analyte-bound substrate with incident light to thereby produce diffracted light;
detecting the intensity of the diffracted light and the intensity of non-diffracted light; and
performing an algorithm that contains as variables the intensity of the diffracted light and the intensity of the non-diffracted light, wherein the algorithm is defined by a formula: (the intensity of diffracted light at ≧1st orders)/(the intensity of the incident light) and the result of the algorithm is used to determine the presence of the analyte.
2. The method of claim 1 , further comprising viewing the diffracted light.
3. The method of claim 1 , wherein the incident light is in the visible spectrum.
4. The method of claim 1 , wherein a light source containing an LED or a laser provides the incident light.
5. The method of claim 1 , wherein the detection is accomplished with a detector that contains a photodiode.
6. The method of claim 1 , wherein the intensity of the non-diffracted light is determined by measuring the intensity of the incident light before contacting the analyte-bound substrate.
7. The method of claim 1 , wherein the intensity of the diffracted light used in the algorithm is determined primarily from upper order diffracted light.
8. The method of claim 1 , wherein the intensity of the diffracted light is detected by blocking the non-diffracted light from a detector and then detecting the intensity of the diffracted light.
9. The method of claim 8 , wherein the intensity of the diffracted light is detected by blocking the diffracted light from the detector and then detecting the intensity of the non-diffracted light.
10. The method of claim 9 , wherein a mask is used to block the diffracted light and the non-diffracted light from the detector.
11. The method of claim 10 , wherein the mask has a first orientation and a second orientation, wherein the diffracted light passes through the mask in the first orientation and the non-diffracted light passes through the mask in the second orientation.
12. The method of claim 11 , wherein the intensity of the diffracted light is determined when the mask is in the first orientation.
13. The method of claim 12 , wherein the intensity of the non-diffracted light is determined when the mask is in the second orientation.
14. The method of claim 1 , further comprising informing a user of the presence or absence of the analyte.
15. The method of claim 1 , wherein the patterned receptor layer is applied to a polymer film.
16. The method of claim 15 , wherein a metal coating is present on the polymer film.
17. The method of claim 1 , wherein the substrate has an optical transparency of between about 20% to about 80%.
18. The method of claim 1 , wherein the incident light transmits light through the substrate.
19. The method of claim 1 , wherein the incident light reflects from the substrate.
20. The method of claim 1 , wherein the non-diffracted light includes zero-order light.
21. The method of claim 1 , wherein the algorithm calculates the difference between the intensity of the diffracted light and the intensity of the non-diffracted light.
22. A method for detecting an analyte in a sample comprising:
providing a substrate that contains a patterned receptor layer applied to a polymer film, the receptor layer containing a receptor material;
binding the analyte to the patterned receptor layer;
contacting the analyte-bound substrate with incident light to thereby produce diffracted light;
positioning a mask in a first orientation to block non-diffracted light from a detector and then detecting the intensity of the diffracted light;
positioning a mask in a second orientation to block the diffracted light from the detector and then detecting the intensity of the non-diffracted light; and
performing an algorithm that contains as variables the intensity of the diffracted light and the intensity of the non-diffracted light, wherein the algorithm is defined by a formula: (intensity of the diffracted light at ≧1st orders)/(intensity of the incident light), and the result of the algorithm is used to determine the presence of the analyte.
23. The method of claim 22 , wherein the algorithm calculates the difference between the intensity of the diffracted light and the intensity of the non-diffracted light.