Systems to view and analyze the results from diffraction-based diagnostics
View Patent ↗An analyzer useful in determining the presence of an analyte using a diffraction based sensing device and methods and systems using this device. The present invention may be used with a variety of different diffraction-based diagnostic methods and systems. The analyzer enhances the accuracy and/or usefulness of these devices in detecting analytes, while providing more ease-of-use and convenience to the user. The analyzer may include a light source, a photodiode, a microprocessor and a display system for informing the user of the result. Other features include mirrors, lenses, a sample holder, and a mask for blocking out some light. The analyzer and related method and system may be used in a large number of environments, including commercial, professional, and individual.
1. A system for detecting an analyte in a sample comprising:
a diffraction-based sensing device comprising a substrate, wherein the substrate comprises a polymer film; and
an analyzer comprising:
a light source for supplying light to the diffraction-based device, wherein the diffraction-based sensing device diffracts light when the analyte is present and does not diffract light when the analyte is not present, the diffracted light comprising light transmitted through or reflected from the substrate;
means for measuring an intensity of diffracted light and an intensity of non-diffracted light;
means for converting the measured intensity of diffracted light and non-diffracted light to a result indicating whether an analyte is present in a sample; and
means for informing a user whether the analyte is present in the sample.
2. The system of claim 1 , wherein the light source, the measuring means, the converting means, and the informing means are all contained within a housing.
3. The system of claim 1 , wherein the light supplied by the light source is in the visible spectrum.
4. The system of claim 1 , wherein the light source is an LED light or a laser light.
5. The system of claim 1 , wherein the measuring means comprises a photodiode.
6. The system of claim 1 , wherein the converting means comprises a microprocessor that includes a software element for performing an algorithm that is based on the intensity of the diffracted light and the intensity of the non-diffracted light.
7. The system of claim 6 , wherein the algorithm calculates the difference between the intensity of the diffracted light and the intensity of the non-diffracted light.
8. The system of claim 1 , wherein the informing means comprises a display system.
9. The system of claim 1 , further comprising a means for holding the sample in place.
10. The system of claim 1 , further comprising a means for directing or enhancing light.
11. The system of claim 10 , wherein the means for directing or enhancing light is selected from mirrors, lenses and combinations thereof.
12. The system of claim 1 , further comprising a mask for blocking specific light from the measuring means.
13. The system of claim 12 , wherein the mask has a first orientation and a second orientation, wherein the diffracted light passes through the mask in the first orientation and the non-diffracted light passes through the mask in the second orientation.
14. The system of claim 13 , wherein the intensity of the diffracted light is determined when the mask is in the first orientation and the intensity of the non-diffracted light is determined when the mask is in the second orientation.
15. The system of claim 13 , wherein the mask is rotatable.
16. The system of claim 1 , wherein a receptor material is disposed on the substrate selected from antigens, antibodies, nucleotides, chelators, enzymes, bacteria, yeasts, fungi, viruses, bacterial pili, bacterial flagellar materials, nucleic acids, polysaccharides, lipids, proteins, carbohydrates, metals, hormones and receptors for the materials.
17. The system of claim 1 , wherein the diffraction-based sensing device employs diffraction enhancing elements specific to the analyte.
18. The system fo claim 1 , wherein the polymer film further comprises a metal coating.
19. The system of claim 18 , wherein the metal coating comprises gold, silver, aluminum, chromium, copper, iron, zirconium, platinum, nickel, or oxides thereof.
20. A system for detecting an analyte in a sample comprising:
a diffraction-based sensing device comprising a substrate, wherein the substrate comprises a polymer film; and
an analyzer comprising:
a light source for supplying light to the diffraction-based device, wherein the diffraction-based sensing device diffracts light when the analyte is present and does not diffract light when the analyte is not present, the diffracted light comprising light transmitted through or reflected from the substrate;
a photodiode for measuring an intensity of diffracted light and an intensity of non-diffracted light;
a microprocessor adapted to receive a measurement from the photodiode, the microprocessor comprising a software element for performing an algorithm that is based on the intensity of the diffracted light and the intensity of the non-diffracted light, wherein the result of the algorithm is used to indicate the presence of the analyte; and
a display system.
21. The system of claim 20 , wherein the light source, the photodiode, the microprocessor, and the display system are all contained within the housing.
22. The system of claim 20 , wherein the light supplied by the light source is in the visible spectrum.
23. The system of claim 20 , wherein the light source is an LED light or a laser light.
24. The system of claim 20 , wherein the algorithm calculates the difference between the intensity of the diffracted light and the intensity of the non-diffracted light.
25. The system of claim 20 , further comprising a means for directing or enhancing light.
26. The system of claim 25 , wherein the means for directing or enhancing light is selected from mirrors, lenses and a combination of both.
27. The system of claim 20 , further comprising a mask for blocking specific light from the photodiode.
28. The system of claim 27 , wherein the mask has a first orientation and a second orientation, wherein the diffracted light passes through the mask in the first orientation and the non-diffracted light passes through the mask in the second orientation.
29. The system of claim 27 , wherein the intensity of the diffracted light is determined when the mask is in the first orientation and the intensity of the non-diffracted light is determined when the mask is in the second orientation.
30. The system of claim 27 , wherein the mask is rotatable.