IP Library Granted Patent US 6,986,955
Granted Patent B2
US 6,986,955 · App. 10/019,082 · Granted Jan 17, 2006

Electronic and optical materials

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Quick Facts
Patent No.
US 6,986,955
App. No.
10/019,082
Granted
Jan 17, 2006
Kind
B2
Abstract

Epitaxial and reduced grain boundary materials are deposited on substrates for use in electronic and optical applications. A specific material disclosed is epitaxial barium strontium titanate ( 14 ) deposited on the C-plane of sapphire ( 12 ).

Claims (16)

1. A material comprising epitaxial Ba x Sr 1-x TiO 3 formed as a layer on the C-plane of a sapphire substrate, wherein x has a value from 0 to 1.

2. The material of claim 1 wherein said layer is between about 100 and about 3000 nanometers thick.

3. The material of claim 1 wherein said layer is between about 300 and about 1000 nanometers thick.

4. The material of claim 1 wherein said Ba x Sr 1-x TiO 3 has a 111 orientation.

5. The material of claim 1 wherein said Ba x Sr 1-x TiO 3 is doped with an ion or ions that change its properties.

6. The material of claim 5 wherein said doping ions comprise cesium and bismuth.

7. The material of claim 1 further comprising conductive electrodes for applying a bias or RF signal to the Ba x Sr 1-x TiO 3 layer.

8. A material comprising epitaxial Ba x Sr 1-x TiO 3 formed as a layer on a sapphire substrate, wherein x has a value from 0.1 to 0.9.

9. The material according to claim 8 wherein x has a value from 0.3 to 0.7.

10. The material according to claim 9 wherein x has a value from 0.4 to 0.6.

11. The material of claim 8 wherein said layer is between about 100 and about 3000 nanometers thick.

12. The material of claim 8 wherein said layer is between about 300 and about 1000 nanometers thick.

13. The material of claim 8 wherein said Ba x Sr 1-x TiO 3 has a 111 orientation.

14. The material of claim 8 wherein said Ba x Sr 1-x TiO 3 is doped with an ion or ions that change its properties.

15. The material of claim 14 wherein said doping ions comprise cesium and bismuth.

16. The material of claim 8 further comprising conductive electrodes for applying a bias or RF signal to the Ba x Sr 1-x TiO 3 layer.

Assignments (3)
SECURITY INTEREST Recorded Mar 7, 2006
From: NGIMAT CO.
To: SILICON VALLEY BANK
Reel/Frame 017303/0974 →
SECURITY AGREEMENT Recorded Mar 2, 2006
From: NGIMAT CO.
To: NORO-MOSELEY PARTNERS IV, L.P.; NORO-MOSELEY PARTNERS IV-B, L.P.; HUNT, ANDREW T.; SMITH, DAVID; HENDERSON, ROY
Reel/Frame 017240/0307 →
SECURITY INTEREST Recorded Jan 12, 2004
From: MICROCOATING TECHNOLOGIES, INC.
To: SILICON VALLEY BANK
Reel/Frame 014901/0263 →